Hardness assurance levels and requirements for single event effects testing of integrated circuits
Chumakov, Alexander I., Sogoyan, Armen V., Smolin, Anatoly A., Ahmetov, Alexey O., Bobrovsky, Dmitry V., Boychenko, Dmitry V., Ryasnoy, Nikolai V., Chumakov, Konstantin A., Churilin, Evgeny V., Gerasimov, Vladimir F., Khaustov, Vitaly V., Sashov, Alexander A., Ulanova, Anastasia V., Yanenko, Andrey V.
Published in Bezopasnostʹ informat͡s︡ionnykh tekhnologiĭ (01.03.2020)
Published in Bezopasnostʹ informat͡s︡ionnykh tekhnologiĭ (01.03.2020)
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