In-Situ Delay Characterization and Local Supply Voltage Adjustment for Compensation of Local Parametric Variations
Eireiner, M., Henzler, S., Georgakos, G., Berthold, J., Schmitt-Landsiedel, D.
Published in IEEE journal of solid-state circuits (01.07.2007)
Published in IEEE journal of solid-state circuits (01.07.2007)
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Journal Article
Conference Proceeding
Aging analysis of circuit timing considering NBTI and HCI
Lorenz, Dominik, Georgakos, Georg, Schlichtmann, Ulf
Published in 2009 15th IEEE International On-Line Testing Symposium (01.06.2009)
Published in 2009 15th IEEE International On-Line Testing Symposium (01.06.2009)
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Conference Proceeding
From Device Aging Physics to Automated Circuit Reliability Sign Off
Schlunder, Christian, Waschneck, Katja, Rotter, Peter, Lachenmann, Susanne, Reisinger, Hans, Ungar, Franz, Georgakos, Georg
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
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Conference Proceeding
Circuit relevant HCS lifetime assessments at single transistors with emulated variable loads
Schlunder, Christian, Proebster, F., Berthold, J., Puschkarsky, Katja, Georgakos, Georg, Gustin, Wolfgang, Reisinger, Hans
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
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Conference Proceeding
A method to analyze the impact of fast-recovering NBTI degradation on the stability of large-scale SRAM arrays
Drapatz, Stefan, Hofmann, Karl, Georgakos, Georg, Schmitt-Landsiedel, Doris
Published in Solid-state electronics (01.11.2011)
Published in Solid-state electronics (01.11.2011)
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Journal Article
Conference Proceeding
HCI vs. BTI? - Neither one's out
Schlunder, C., Aresu, S., Georgakos, G., Kanert, W., Reisinger, H., Hofmann, K., Gustin, W.
Published in 2012 IEEE International Reliability Physics Symposium (IRPS) (01.04.2012)
Published in 2012 IEEE International Reliability Physics Symposium (IRPS) (01.04.2012)
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Conference Proceeding
Aging-aware Timing Analysis of Combinatorial Circuits on Gate Level
Lorenz, Dominik, Georgakos, Georg, Schlichtmann, Ulf
Published in Information technology (Munich, Germany) (01.08.2010)
Published in Information technology (Munich, Germany) (01.08.2010)
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Journal Article
Dynamic state-retention flip-flop for fine-grained power gating with small design and power overhead
Henzler, S., Georgakos, G., Eireiner, M., Nirschl, T., Pacha, C., Berthold, J., Schmitt-Landsiedel, D.
Published in IEEE journal of solid-state circuits (01.07.2006)
Published in IEEE journal of solid-state circuits (01.07.2006)
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Journal Article
Conference Proceeding
Impact of fast-recovering NBTI degradation on stability of large-scale SRAM arrays
Drapatz, S, Hofmann, K, Georgakos, G, Schmitt-Landsiedel, D
Published in 2010 Proceedings of the European Solid State Device Research Conference (01.09.2010)
Published in 2010 Proceedings of the European Solid State Device Research Conference (01.09.2010)
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Conference Proceeding
A 90-nm CMOS Low-Power GSM/EDGE Multimedia-Enhanced Baseband Processor With 380-MHz ARM926 Core and Mixed-Signal Extensions
Lueftner, T., Berthold, J., Pacha, C., Georgakos, G., Sauzon, G., Hoemke, O., Beshenar, J., Mahrla, P., Just, K., Hober, P., Henzler, S., Schmitt-Landsiedel, D., Yakovleff, A., Klein, A., Knight, R.J., Acharya, P., Bonnardot, A., Buch, S., Sauer, M.
Published in IEEE journal of solid-state circuits (01.01.2007)
Published in IEEE journal of solid-state circuits (01.01.2007)
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Journal Article
Conference Proceeding
CIRCUITS AND TECHNIQUES FOR PREDICTING FAILURE OF CIRCUITS BASED ON STRESS ORIGINATION METRICS AND STRESS VICTIM EVENTS
Kleeberger, Veit, Zalman, Rafael, Georgakos, Georg, Zettler, Thomas, Rossmeier, Ludwig, Hammerschmidt, Dirk, Gstoettenbauer, Bernhard
Year of Publication 01.06.2023
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Year of Publication 01.06.2023
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