Scaling properties of the tunneling field effect transistor (TFET): Device and circuit
Nirschl, Th, Henzler, St, Fischer, J., Fulde, M., Bargagli-Stoffi, A., Sterkel, M., Sedlmeir, J., Weber, C., Heinrich, R., Schaper, U., Einfeld, J., Neubert, R., Feldmann, U., Stahrenberg, K., Ruderer, E., Georgakos, G., Huber, A., Kakoschke, R., Hansch, W., Schmitt-Landsiedel, D.
Published in Solid-state electronics (2006)
Published in Solid-state electronics (2006)
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Conference Proceeding
In-Situ Delay Characterization and Local Supply Voltage Adjustment for Compensation of Local Parametric Variations
Eireiner, M., Henzler, S., Georgakos, G., Berthold, J., Schmitt-Landsiedel, D.
Published in IEEE journal of solid-state circuits (01.07.2007)
Published in IEEE journal of solid-state circuits (01.07.2007)
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Conference Proceeding
Comparison of in-situ delay monitors for use in Adaptive Voltage Scaling
Pour Aryan, N, HeiÃ, L, Schmitt-Landsiedel, D, Georgakos, G, Wirnshofer, M
Published in Advances in radio science (18.09.2012)
Published in Advances in radio science (18.09.2012)
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Journal Article
Dynamic state-retention flip-flop for fine-grained power gating with small design and power overhead
Henzler, S., Georgakos, G., Eireiner, M., Nirschl, T., Pacha, C., Berthold, J., Schmitt-Landsiedel, D.
Published in IEEE journal of solid-state circuits (01.07.2006)
Published in IEEE journal of solid-state circuits (01.07.2006)
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Conference Proceeding
Highly accurate product-level aging monitoring in 40nm CMOS
Hofmann, K, Reisinger, H, Ermisch, K, Schlunder, C, Gustin, W, Pompl, T, Georgakos, G, Arnim, K v, Hatsch, J, Kodytek, T, Baumann, T, Pacha, C
Published in 2010 Symposium on VLSI Technology (01.06.2010)
Published in 2010 Symposium on VLSI Technology (01.06.2010)
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Conference Proceeding
Fast power-efficient circuit-block switch-off scheme
Henzler, S., Georgakos, G., Berthold, J., Schmitt-Landsiedel, D.
Published in Electronics letters (22.01.2004)
Published in Electronics letters (22.01.2004)
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Journal Article
Impact of process variations and long term degradation on 6T-SRAM cells
Fischer, Th, Olbrich, A, Georgakos, G, Lemaitre, B, Schmitt-Landsiedel, D
Published in Advances in radio science (13.06.2007)
Published in Advances in radio science (13.06.2007)
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Journal Article
A 90-nm CMOS Low-Power GSM/EDGE Multimedia-Enhanced Baseband Processor With 380-MHz ARM926 Core and Mixed-Signal Extensions
Lueftner, T., Berthold, J., Pacha, C., Georgakos, G., Sauzon, G., Hoemke, O., Beshenar, J., Mahrla, P., Just, K., Hober, P., Henzler, S., Schmitt-Landsiedel, D., Yakovleff, A., Klein, A., Knight, R.J., Acharya, P., Bonnardot, A., Buch, S., Sauer, M.
Published in IEEE journal of solid-state circuits (01.01.2007)
Published in IEEE journal of solid-state circuits (01.01.2007)
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Conference Proceeding
Theory of circuit block switch-off
Henzler, S, Berthold, J, Georgakos, G, Schmitt-Landsiedel, D
Published in Advances in radio science (27.05.2005)
Published in Advances in radio science (27.05.2005)
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Journal Article
Timing violations due to VDD/VSS bounce
Eireiner, M, Henzler, S, Berthold, J, Pacha, C, Georgakos, G, Schmitt-Landsiedel, D
Published in Advances in radio science (01.01.2006)
Published in Advances in radio science (01.01.2006)
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Journal Article
Impact of Level-Converter on Power-Saving Capability of Clustered Voltage Scaling
Henzler, St, Berthold, J, Koban, M, Reinl, M, Georgakos, G, Schmitt-Landsiedel, D
Published in Advances in radio science (13.05.2005)
Published in Advances in radio science (13.05.2005)
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Journal Article
Design and technology of fine-grained sleep transistor circuits in ultra-deep sub-micron CMOS technologies
Henzler, S., Nirschl, T., Berthold, J., Georgakos, G., Schmitt-Landsiedel, D.
Published in 2005 International Conference on Integrated Circuit Design and Technology, 2005. ICICDT 2005 (2005)
Published in 2005 International Conference on Integrated Circuit Design and Technology, 2005. ICICDT 2005 (2005)
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Conference Proceeding
Dynamic state-retention flip flop for fine-grained sleep-transistor scheme
Henzler, S., Nirschi, T., Pacha, C., Spindler, P., Teichmann, P., Fulde, M., Fischer, J., Eireiner, M., Fischer, T., Georgakos, G., Berthold, J., Schmitt-Landsiedel, D.
Published in Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005 (2005)
Published in Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005 (2005)
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Conference Proceeding
The tunneling field effect transistor (TFET) as an add-on for ultra-low-voltage analog and digital processes
Nirschl, Th, Wang, P.-F., Weber, C., Sedlmeir, J., Heinrich, R., Kakoschke, R., Schrufer, K., Holz, J., Pacha, C., Schulz, T., Ostermayr, M., Olbrich, A., Georgakos, G., Ruderer, E., Hansch, W., Schmitt-Landsiedel, D.
Published in IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 (2004)
Published in IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 (2004)
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Conference Proceeding
Investigation of Increased Multi-Bit Failure Rate Due to Neutron Induced SEU in Advanced Embedded SRAMs
Georgakos, G., Huber, P., Ostermayr, M., Amirante, E., Ruckerbauer, F.
Published in 2007 IEEE Symposium on VLSI Circuits (01.06.2007)
Published in 2007 IEEE Symposium on VLSI Circuits (01.06.2007)
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Conference Proceeding
HCI vs. BTI? - Neither one's out
Schlunder, C., Aresu, S., Georgakos, G., Kanert, W., Reisinger, H., Hofmann, K., Gustin, W.
Published in 2012 IEEE International Reliability Physics Symposium (IRPS) (01.04.2012)
Published in 2012 IEEE International Reliability Physics Symposium (IRPS) (01.04.2012)
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Conference Proceeding
A fWLR test structure and method for device reliability monitoring using product relevant circuits
Vollertsen, R.-P, Georgakos, G., Kolpin, K., Olk, C.
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
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Conference Proceeding
The tunneling field effect transistor (TFET) used in a single-event-upset (SEU) insensitive 6 transistor SRAM cell in ultra-low voltage applications
Nirschl, T., Henzler, S., Pacha, C., Peng-Fei Wang, Hansch, W., Georgakos, G., Schmitt-Landsiedel, D.
Published in 4th IEEE Conference on Nanotechnology, 2004 (2004)
Published in 4th IEEE Conference on Nanotechnology, 2004 (2004)
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Conference Proceeding
A new 3-bit burst-error correcting code
Klockmann, A., Georgakos, G., Goessel, M.
Published in 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) (01.07.2017)
Published in 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) (01.07.2017)
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