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Wentlent, Luke A., Genanu, Mohammed, Alghoul, Thaer
Published in 2018 IEEE 68th Electronic Components and Technology Conference (ECTC) (01.05.2018)
Published in 2018 IEEE 68th Electronic Components and Technology Conference (ECTC) (01.05.2018)
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Conference Proceeding
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Genanu, Mohammed, Mutuku, Francis, Cotts, Eric J., Wilcox, James, Arfaei, Babak, Perfecto, Eric
Published in 2017 IEEE 67th Electronic Components and Technology Conference (ECTC) (01.05.2017)
Published in 2017 IEEE 67th Electronic Components and Technology Conference (ECTC) (01.05.2017)
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Conference Proceeding
Reliability Assessment and Microstructure Characterization of Cu Pillars Assembled on Si and Glass Substrates
Genanu, Mohammed, Mutuku, Francis, Cotts, Eric J., Perfecto, Eric, Pollard, Scott, Shorey, Aric, Arfaei, Babak
Published in 2016 IEEE 66th Electronic Components and Technology Conference (ECTC) (01.05.2016)
Published in 2016 IEEE 66th Electronic Components and Technology Conference (ECTC) (01.05.2016)
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Conference Proceeding
Microstructure and Reliability of Tin-Silver Micro-Copper Pillar Assemblies
Genanu, Mohammed, Arfaei, Babak, Cotts, Eric J., Mutuku, Francis, Perfecto, Eric, Pollard, Scott, Shorey, Aric
Published in Electronic device failure analysis (01.02.2018)
Published in Electronic device failure analysis (01.02.2018)
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