by Geewhun Seok, Hong Kim, Mohammad, B.
Published in 2012 IEEE 30th VLSI Test Symposium (VTS) (01.04.2012)

by Geewhun Seok, Il-Soo Lee, Ambler, T., Womack, B.F.
Published in 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (01.10.2006)