Electron Probe Measurements of Oxide Film Thickness on Silicon Surfaces
Gavrilenko, V. P., Kuzin, A. Yu, Mityukhlyaev, V. B., Stepovich, M. A., Todua, P. A., Filippov, M. N.
Published in Measurement techniques (01.12.2015)
Published in Measurement techniques (01.12.2015)
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Journal Article
Measurement of Structural Parameters Based on X-Ray Emission Spectra with Energy-Dispersive Detection
Gavrilenko, V. P., Zablotskii, A. V., Korneichuk, S. A., Kuzin, A. Yu, Kupriyanova, T. A., Lyamina, O. I., Todua, P. A., Filippov, M. N., Shklover, V. Ya
Published in Measurement techniques (01.05.2016)
Published in Measurement techniques (01.05.2016)
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Journal Article
Three-Dimensional Reconstruction of the Surfaces of Relief Structures from Stereoscopic Images Obtained in a Scanning Electron Microscope
Gavrilenko, V. P., Karabanov, D. A., Kuzin, A. Yu, Mityukhlyaev, V. B., Mikhutkin, A. A., Todua, P. A., Filippov, M. N., Baimukhametov, T. N., Vasil’ev, A. L.
Published in Measurement techniques (01.06.2015)
Published in Measurement techniques (01.06.2015)
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Journal Article
A significant enhancement of high-order harmonic generation by using a dipole gas
Gavrilenko, V P, Oks, E
Published in Journal of physics. B, Atomic, molecular, and optical physics (28.04.2000)
Published in Journal of physics. B, Atomic, molecular, and optical physics (28.04.2000)
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Journal Article
Reference material for transmission electron microscope calibration
Filippov, M N, Gavrilenko, V P, Kovalchuk, M V, Mityukhlyaev, V B, Ozerin, Yu V, Rakov, A V, Roddatis, V V, Todua, P A, Vasiliev, A L
Published in Measurement science & technology (01.09.2011)
Published in Measurement science & technology (01.09.2011)
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Journal Article
Method to measure the electric field vector in an argon glow discharge using laser polarization spectroscopy
Gavrilenko, V P, Kim, H J, Ikutake, T, Kim, J B, Bowden, M D, Muraoka, K
Published in Physical review. E, Statistical, nonlinear, and soft matter physics (01.04.2001)
Published in Physical review. E, Statistical, nonlinear, and soft matter physics (01.04.2001)
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Journal Article
First Russian standards in nanotechnology
Gavrilenko, V. P., Lesnovsky, E. N., Novikov, Yu. A., Rakov, A. V., Todua, P. A., Filippov, M. N.
Published in Bulletin of the Russian Academy of Sciences. Physics (01.04.2009)
Published in Bulletin of the Russian Academy of Sciences. Physics (01.04.2009)
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Journal Article
Distortion of the Profile of Surface Relief Elements of Single-Crystal Silicon Caused by Contamination in a Low-Voltage Scanning Electron Microscope
Gavrilenko, V. P., Kuzin, A. Yu, Mityukhlyaev, V. B., Rakov, A. V., Todua, P. A., Filippov, M. N., Sharonov, V. A.
Published in Measurement techniques (01.06.2013)
Published in Measurement techniques (01.06.2013)
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Journal Article
Standard sample for calibration of transmission electron microscopes nanometrology
Bodunov, D. S., Gavrilenko, V. P., Zablotskii, A. V., Kuzin, A. A., Kuzin, A. Yu, Mityukhlyaev, V. B., Rakov, A. V., Todua, P. A., Filippov, M. N.
Published in Measurement techniques (2013)
Published in Measurement techniques (2013)
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Journal Article
Polarization of a dipole gas under a resonant interaction with a strong bichromatic field
Gavrilenko, V P, Oks, E
Published in Journal of physics. B, Atomic, molecular, and optical physics (28.04.1995)
Published in Journal of physics. B, Atomic, molecular, and optical physics (28.04.1995)
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Journal Article
Scan nonlinearity of a scanning electron microscope
Alzoba, V. V., Gavrilenko, V. P., Kuzin, A. Yu, Mityukhlyaev, V. B., Rakov, A. V., Todua, P. A., Filippov, M. N.
Published in Measurement techniques (01.12.2012)
Published in Measurement techniques (01.12.2012)
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Journal Article