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Application of Spectroscopic Ellipsometry and Mueller Ellipsometry to Optical Characterization
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Published in arXiv.org (10.01.2013)
Published in arXiv.org (10.01.2013)
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INSTANTANEOUS ELLIPSOMETER OR SCATTEROMETER AND ASSOCIATED MEASURING METHOD
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DEVICE FOR DEPOSITING NANOMETRIC SIZED PARTICLES ONTO A SUBSTRATE
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Year of Publication 15.04.2021
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DEVICE FOR DEPOSITING NANOMETRIC SIZED PARTICLES ONTO A SUBSTRATE
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Year of Publication 09.12.2020
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Year of Publication 09.12.2020
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INSTANTANEOUS ELLIPSOMETER OR SCATTEROMETER AND ASSOCIATED MEASURING METHOD
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Year of Publication 15.01.2021
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Year of Publication 15.01.2021
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