by Moens, P., Liu, C., Banerjee, A., Vanmeerbeek, P., Coppens, P., Ziad, H., Constant, A., Li, Z., De Vleeschouwer, H., Roig-Guitart, J., Gassot, P., Bauwens, F., De Backer, E., Padmanabhan, B., Salih, A., Parsey, J., Tack, M.
Published in 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.06.2014)

by Cortes, I., Roig, J., Moens, P., Mouhoubi, S., Gassot, P., Rebollo, J., Bauwens, F., Flores, D.
Published in IEEE electron device letters (01.09.2012)

by Charavel, R., Roig, J., Mouhoubi, S., Gassot, P., Bauwens, F., Vanmeerbeek, P., Desoete, B., Moens, P., De Backer, E.
Published in Microelectronics and reliability (01.09.2010)

by Mouhoubi, S., Wu, Y., Bauwens, F., Roig, J., Gassot, P., Tack, M.
Published in 2012 24th International Symposium on Power Semiconductor Devices and ICs (01.06.2012)

by Roig, J, Mouhoubi, S, Gassot, P, Charavel, R, Suvkhanov, A, Moens, P, Bauwens, F, Tack, M
Published in 2010 22nd International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.06.2010)

by Medjahed, D., Yao, T., Wojciechowski, D., Gassot, P., Yameogo, M.
Published in 2007 IEEE International Conference on Microelectronic Test Structures (01.03.2007)

by Gassot, P., Desoete, B., Gillon, R., Bolognesi, D., Tack, M.
Published in ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003 (2003)

by Van den Bosch, G., Driessens, E., Webers, T., Elattari, B., Wojciechowski, D., Gassot, P., Moens, P., Groeseneken, G.
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)

by Gassot, P., Gennser, Ulf, Symons, D.M., Zaslavsky, A., Grützmacher, D.A., Portal, J.C.
Published in Physica. E, Low-dimensional systems & nanostructures (01.07.1998)

by Gennser, Ulf, Zaslavsky, A., Grützmacher, D.A., Gassot, P., Portal, J.C.
Published in Applied surface science (01.08.1996)

by Gassot, P., Dmowski, L., Eremets, M., Aristone, F., Goutiers, B., Gauffier, J.L., Maude, D.K., Palmier, J.F., Portal, J.C., Harmand, J.C., Mollot, F.
Published in Solid-state electronics (1996)

by Charavel, R., Roig, J., Mouhoubi, S., Gassot, P., Bauwens, F., Vanmeerbeek, P., Desoete, B., Moens, P., De Backer, E.
Published in Microelectronics and reliability (01.09.2010)

by Van den bosch, G., Moens, P., Gassot, P., Wojciechowski, D., Groeseneken, G.
Published in Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) (2004)

by Mouhoubi, S., Bauwens, F., Roig, J., Gassot, P., Moens, P., Tack, M.
Published in 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs (01.05.2011)

by Gassot, P, Genoe, J, Maude, DK, Portal, JC, Dalton, KS, Symons, DM, Nicholas, RJ, Aristone, F, Palmier, JF, Laruelle, F
Published in Physical review. B, Condensed matter (15.11.1996)

by Roig, J., Moens, P., Bauwens, F., Medjahed, D., Mouhoubi, S., Gassot, P.
Published in 2009 21st International Symposium on Power Semiconductor Devices & IC's (01.06.2009)

by Aristone, F., Gassot, P., Palmier, J.F., Maude, D.K., Goutiers, B., Gauffier, J.L., Portal, J.C., Mollot, F.
Published in Superlattices and microstructures (1994)

by Ackaert, J., Yao, T., Lowe, A., Gassot, P., Ooghe, W., Schlegel, L., Bogaert, P., Branquart, H.
Published in 2006 IEEE International Conference on IC Design and Technology (2006)

by Van den bosch, G., Webers, T., Driessens, E., Elattari, B., Wojciechowski, D., Gassot, P., Moens, P., Groeseneken, G.
Published in Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005 (2005)

by Gennser, Ulf, Zaslavsky, A., Grützmacher, D.A., Gassot, P., Portal, J.C.
Published in Applied surface science (1996)