Accuracy of the in situ determination of the CdZnTe temperature by ellipsometry before the growth of HgCdTe by MBE
Badano, Giacomo, Garland, James W., Sivananthan, S.
Published in Journal of crystal growth (01.04.2003)
Published in Journal of crystal growth (01.04.2003)
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Conference Proceeding
Composition and thickness distribution of HgCdTe molecular beam epitaxy wafers by infrared microscope mapping
Chang, Yong, Badano, G., Jiang, E., Garland, J.W., Zhao, J., Grein, C.H., Sivananthan, S.
Published in Journal of crystal growth (15.04.2005)
Published in Journal of crystal growth (15.04.2005)
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Journal Article
In-situ ellipsometry studies of adsorption of Hg on CdTe(211)B/Si(211) and molecular beam epitaxy growth of hgcdte(211)B
BADANO, G, CHANG, Y, GARLAND, J. W, SIVANANTHAN, S
Published in Journal of electronic materials (01.06.2004)
Published in Journal of electronic materials (01.06.2004)
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Conference Proceeding
Journal Article
Ellipsometric study of the nucleation of (2 1 1) HgCdTe on CdZnTe(2 1 1)B
Badano, G., Zhao, J., Chang, Y., Garland, J.W., Sivananthan, S.
Published in Journal of crystal growth (01.11.2003)
Published in Journal of crystal growth (01.11.2003)
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Journal Article
Improvement of the accuracy of the in-situ ellipsometric measurements of temperature and alloy composition for MBE grown HgCdTe LWIR/MWIR structures
DARASELIA, M, GARLAND, J. W, JOHS, B, NATHAN, V, SIVANANTHAN, S
Published in Journal of electronic materials (01.06.2001)
Published in Journal of electronic materials (01.06.2001)
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Journal Article
Arsenic incorporation in MBE grown Hg1−xCdxTe
Grein, C. H., Garland, J. W., Sivananthan, S., Wijewarnasuriya, P. S., Aqariden, F., Fuchs, M.
Published in Journal of electronic materials (01.06.1999)
Published in Journal of electronic materials (01.06.1999)
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In-situ control of temperature and alloy composition of Cd1−xZnxTe grown by molecular beam epitaxy
Daraselia, M., Brill, G., Garland, J. W., Nathan, V., Sivananthan, S.
Published in Journal of electronic materials (01.06.2000)
Published in Journal of electronic materials (01.06.2000)
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Determination of accurate critical-point energies, linewidths and line shapes from spectroscopic ellipsometry data
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Conference Proceeding
Charge trapping and built-in field studies in electroreflectance of a UN+ GaAs structure
MIOC, S. L, GARLAND, J. W, BENNETT, B. R
Published in Semiconductor science and technology (01.04.1996)
Published in Semiconductor science and technology (01.04.1996)
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Theory of magnetization and exchange-enhanced susceptibility of Pd-Ni alloys
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Journal Article
Effects of Zn and Ga interdiffusion on ZnSe/n+GaAs interfaces
Kassel, L, Garland, J W, Raccah, P M, Haase, M A, Cheng, H
Published in Semiconductor science and technology (01.09.1991)
Published in Semiconductor science and technology (01.09.1991)
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Journal Article
Study of surface field in n-type GaAs before and after surface doping with H2
Kassel, L., Garland, J.W., Raccah, P.M., Coluzza, C., Neglia, A., DiCarlo, A.
Published in Applied surface science (1992)
Published in Applied surface science (1992)
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Electroreflectance determination of the band profile of ZnSe/n+ GaAs heterojunction
Kassel, L, Garland, J W, Raccah, P M, Tamargo, M C, Farrell, H H
Published in Semiconductor science and technology (01.09.1991)
Published in Semiconductor science and technology (01.09.1991)
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Journal Article
Observation of transitions between electronic states at the (111) A-face of CdTe by electrolyte electroreflectance
Raccah, PM, Garland, JW, Zhang, Z, Abels, LL, Ugur, S, Mioc, S, Brown, M
Published in Physical review letters (16.09.1985)
Published in Physical review letters (16.09.1985)
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Magnetic polarization clouds, percolation, and the critical concentration for ferromagnetism
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Study of mercury cadmium telluride epilayers grown by metalorganic vapor-phase epitaxy
Raccah, P. M., Garland, J. W., Zhang, Z., Lee, U., Ugur, S., Mioc, S., Ghandi, S. K., Bhat, I.
Published in Journal of applied physics (01.01.1985)
Published in Journal of applied physics (01.01.1985)
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