by Xiang, Y., Bardon, M. Garcia, Kaczer, B., Alam, Md Nur K., Ragnarsson, L.-A., Kaczmarek, K., Parvais, B., Groeseneken, G., Van Houdt, J.
Published in IEEE transactions on electron devices (01.04.2021)

by Kaczmarek, K., Bardon, M. Garcia, Xiang, Y., Ronchi, N., Ragnarsson, L.-A., Celano, U., Banerjee, K., Kaczer, B., Groeseneken, G., Houdt, J. Van
Published in IEEE transactions on electron devices (01.07.2023)

by Yakimets, D., Bardon, M. Garcia, Jang, D., Schuddinck, P., Sherazi, Y., Weckx, P., Miyaguchi, K., Parvais, B., Raghavan, P., Spessot, A., Verkest, D., Mocuta, A.
Published in 2017 IEEE International Electron Devices Meeting (IEDM) (01.12.2017)

by Bardon, M. Garcia, Sherazi, Y., Jang, D., Yakimets, D., Schuddinck, P., Baert, R., Mertens, H., Mattii, L., Parvais, B., Mocuta, A., Verkest, D.
Published in 2018 IEEE Symposium on VLSI Technology (01.06.2018)

by Gupta, M., Xiang, Y., Garcia-Redondo, F., Cai, K., Abdi, D., Liu, H.-H., Rao, S., Hiblot, G., Couet, S., Garcia-Bardon, M., Hellings, G.
Published in Technical digest - International Electron Devices Meeting (09.12.2023)

by Garcia-Redondo, F., Rao, S., Gupta, M., Perumkunnil, M., Xiang, Y., Abdi, D., Van Beek, S., Couet, S., Garcia-Bardon, M.
Published in ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) (11.09.2023)

by Yang, S., Schuddinck, P., Garcia-Bardon, M., Xiang, Y., Veloso, A., Chan, B T, Mirabelli, G., Hiblot, G., Hellings, G., Ryckaert, J.
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)

by Garcia Bardon, M., Wuytens, P., Ragnarsson, L.-A., Mirabelli, G., Jang, D., Willems, G., Mallik, A., Spessot, A., Ryckaert, J., Parvais, B.
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)

by Boakes, L., Garcia Bardon, M., Schellekens, V., Liu, I-Y., Vanhouche, B., Mirabelli, G., Sebaai, F., Van Winckel, L., Gallagher, E., Rolin, C., Ragnarsson, L.-A.
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)

by Horiguchi, N., Mertens, H., Chiarella, T., Demuynck, S., Vega-Gonzalez, V., Vandooren, A., Veloso, A., Bardon, M. Garcia, Sisto, G., Gupta, A., Tokei, Z., Biesemans, S., Ryckaert, J.
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)

by Veloso, A., Vermeersch, B., Chen, R., Matagne, P., Bardon, M. Garcia, Eneman, G., Serbulova, K., Zografos, O., Chen, S. H., Sisto, G., Jourdain, A., Arimura, H., O'Sullivan, B., De Keersgieter, A., Hellings, G., Beyne, E., Horiguchi, N., Ryckaert, J.
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)

by Kaczmarek, K., Bardon, M. Garcia, Xiang, Y., Breuil, L., Ronchi, N., Parvais, B., Groeseneken, G., van Houdt, J.
Published in 2021 IEEE International Memory Workshop (IMW) (01.05.2021)

by Xiang, Y., Verhulst, A. S., Parvais, B., Horiguchi, N., Groeseneken, G., Houdt, J. Van, Bardon, M. Garcia, Alam, Md Nur K., Thesberg, M., Kaczer, B., Roussel, P., Popovici, M. I., Ragnarsson, L.-A., Truijen, B.
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)

by Anchlia, A., Garcia Bardon, M., Poliakov, P., Rooseleer, B., De Wachter, B., Collaert, N., van der Zanden, K., Corbalan, M. Miranda, Dehaene, W., Verkest, D.
Published in 2009 IEEE International Workshop on Memory Technology, Design, and Testing (01.08.2009)

by Liu, I.-Y., Winckel, L. Van, Boakes, L., Bardon, M. Garcia, Rolin, C., Ragnarsson, L.-A.
Published in IEEE transactions on semiconductor manufacturing (05.06.2024)

by Das, Uttam Kumar, Garcia Bardon, M., Jang, D., Eneman, G., Schuddinck, P., Yakimets, D., Raghavan, P., Groeseneken, Guido
Published in IEEE electron device letters (01.01.2017)

by Garcia-Redondo, F., Verschueren, L., Rao, S., Pandey, P., Abdi, D., Weckx, P., Couet, S., Garcia-Bardon, M., Hellings, G.
Published in 2024 IEEE European Solid-State Electronics Research Conference (ESSERC) (09.09.2024)

by Bardon, M. Garcia, Sherazi, Y., Schuddinck, P., Jang, D., Yakimets, D., Debacker, P., Baert, R., Mertens, H., Badaroglu, M., Mocuta, A., Horiguchi, N., Mocuta, D., Raghavan, P., Ryckaert, J., Spessot, A., Verkest, D., Steegen, A.
Published in 2016 IEEE International Electron Devices Meeting (IEDM) (01.12.2016)

by Abdi, D., Brunion, M., Garcia-Redondo, F., Weckx, P., Boemmels, J., Verschueren, L., Farokhnejad, A., Garcia-Bardon, M., Hellings, G., Ryckaert, J.
Published in 2024 IEEE European Solid-State Electronics Research Conference (ESSERC) (09.09.2024)

by Bardon, M. Garcia, Schuddinck, P., Raghavan, P., Jang, D., Yakimets, D., Mercha, A., Verkest, D., Thean, A.
Published in 2015 International Conference on IC Design & Technology (ICICDT) (01.06.2015)