CMOS Scaling Challenges for High Performance and Low Power applications facing Reliability Criteria towards the Decananometer range
Bravaix, A, Hamparsoumian, G, Sonzogni, J, Pitard, H, Garba-Seybou, T, Kussener, E, Federspiel, X, Cacho, F
Published in Journal of physics. Conference series (01.07.2023)
Published in Journal of physics. Conference series (01.07.2023)
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Journal Article
Analysis of the interactions of HCD under "On" and "Off" state modes for 28nm FDSOI AC RF modelling
Garba-Seybou, T., Federspiel, X., Bravaix, A., Cacho, F.
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
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Conference Proceeding
Integrated Test Circuit for Off-State Dynamic Drain Stress Evaluation
Hai, J., Cacho, F., Federspiel, X., Garba-Seybou, T., Divay, A., Lauga-Larroze, E., Arnould, J.-D.
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
Device Reliability to Circuit Qualification: Insights and Challenges
Cacho, F., Bravaix, A., Seybou, T. Garba, Pitard, H., Federspiel, X., Kumar, T., Giner, F., Michard, A., Celeste, D., Miller, B., Dhanda, V., Varshney, A., Tripathi, V., Kumar, J.
Published in 2022 IEEE International Integrated Reliability Workshop (IIRW) (09.10.2022)
Published in 2022 IEEE International Integrated Reliability Workshop (IIRW) (09.10.2022)
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Conference Proceeding
Modeling hot carrier damage interaction between on and off modes for 28 nm AC RF applications
Garba-Seybou, T., Bravaix, A., Federspiel, X., Cacho, F.
Published in Microelectronics and reliability (01.11.2021)
Published in Microelectronics and reliability (01.11.2021)
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Journal Article