Fast Algorithms for Exact IR Drop De-Embedding in Analog Multiply-Accumulate Computing
Gao, Shifan, Yang, Fan, Lu, Cimang, Zhao, Yi
Published in IEEE transactions on electron devices (01.11.2022)
Published in IEEE transactions on electron devices (01.11.2022)
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Journal Article
An Euler-Lagrange Equation Oriented Solution for Write Energy Minimization of STT-MRAM
Chen, Bing, Gao, Shifan, Qu, Yiming, Xu, Nuo, Zhao, Yi
Published in IEEE transactions on electron devices (01.08.2019)
Published in IEEE transactions on electron devices (01.08.2019)
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Journal Article
High-efficiency array-level MRAM parameters extraction with the device-in-series test structure
Zhang, Zeyu, Gao, Shifan, Zhao, Yi, Yang, Xiaolei, Zhao, Jiankun, He, Shikun
Published in Journal of applied physics (31.01.2022)
Published in Journal of applied physics (31.01.2022)
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Journal Article
Study on displacement damage effect of highly charged ions in carbon nanotube field-effect transistor
Yang, Xirong, Zeng, Jian, Liu, Jie, Zhang, Shengxia, Zhang, Hongda, Gao, Shifan, Zhai, Pengfei, Cai, Li, Hu, Peipei, Liu, Li
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.07.2024)
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.07.2024)
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Journal Article
Schottky barrier reduction on optoelectronic responses in heavy ion irradiated WSe memtransistors
Zhang, Shengxia, Xu, Lijun, Gao, Shifan, Hu, Peipei, Liu, Jiande, Zeng, Jian, Li, Zongzhen, Zhai, Pengfei, Liu, Li, Cai, Li, Liu, Jie
Published in Nanoscale (16.05.2024)
Published in Nanoscale (16.05.2024)
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Journal Article
Schottky barrier reduction on optoelectronic responses in heavy ion irradiated WSe2 memtransistors
Zhang, Shengxia, Xu, Lijun, Gao, Shifan, Hu, Peipei, Liu, Jiande, Zeng, Jian, Li, Zongzhen, Zhai, Pengfei, Liu, Li, Cai, Li, Liu, Jie
Published in Nanoscale (16.05.2024)
Published in Nanoscale (16.05.2024)
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Journal Article
Schottky barrier reduction on optoelectronic responses in heavy ion irradiated WSe 2 memtransistors
Zhang, Shengxia, Xu, Lijun, Gao, Shifan, Hu, Peipei, Liu, Jiande, Zeng, Jian, Li, Zongzhen, Zhai, Pengfei, Liu, Li, Cai, Li, Liu, Jie
Published in Nanoscale (16.05.2024)
Published in Nanoscale (16.05.2024)
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Journal Article
Fermi-Level Pinning Engineering for Achieving High-Performance Ge-Based Resistive Memory With Ultrahigh Self-Rectifying Ratio (> 105)
Ding, Xiang, Wei, Na, Qu, Yiming, Lan, Zhangsheng, Yu, Xinwei, Yan, Chu, Weng, Zeping, Gao, Shifan, Nishimura, Tomonori, Zhao, Liang, Lee, Choonghyun, Zhao, Yi
Published in IEEE transactions on electron devices (01.12.2022)
Published in IEEE transactions on electron devices (01.12.2022)
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Journal Article
HfO[sub.x]/Ge RRAM with High ON/OFF Ratio and Good Endurance
Wei, Na, Ding, Xiang, Gao, Shifan, Wu, Wenhao, Zhao, Yi
Published in Electronics (Basel) (01.11.2022)
Published in Electronics (Basel) (01.11.2022)
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Journal Article
105
Ding, Xiang, Na, Wei, Qu, Yiming, Zhangsheng Lan, Yu, Xinwei, Chu, Yan, Weng, Zeping, Gao, Shifan, Nishimura, Tomonori, Zhao, Liang, Lee, Choonghyun, Zhao, Yi
Published in IEEE transactions on electron devices (01.01.2022)
Published in IEEE transactions on electron devices (01.01.2022)
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Journal Article
Current Research Status and Future Prospect of the In-Memory Computing
Gao, Shifan, Yang, Fan, Zhao, Liang, Zhao, Yi
Published in 2021 IEEE 14th International Conference on ASIC (ASICON) (26.10.2021)
Published in 2021 IEEE 14th International Conference on ASIC (ASICON) (26.10.2021)
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Conference Proceeding
HfOx/Ge RRAM with High ON/OFF Ratio and Good Endurance
Wei, Na, Ding, Xiang, Gao, Shifan, Wu, Wenhao, Zhao, Yi
Published in Electronics (Basel) (01.11.2022)
Published in Electronics (Basel) (01.11.2022)
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Journal Article
A Compute-in-Memory Architecture Compatible with 3D NAND Flash that Parallelly Activates Multi-Layers
Zhao, Liang, Yan, Chu, Yang, Fan, Gao, Shifan, Rosca, Gabriel, Manea, Dan, Lu, Zhichao, Zhao, Yi
Published in 2021 58th ACM/IEEE Design Automation Conference (DAC) (05.12.2021)
Published in 2021 58th ACM/IEEE Design Automation Conference (DAC) (05.12.2021)
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Conference Proceeding
Probing Write Error Rate and Random Telegraph Noise of MgO Based Magnetic Tunnel Juction Using a High Throughput Characterization System
Gao, Shifan, Chen, Bing, Xu, Nuo, Qu, Yiming, Zhao, Yi
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
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Conference Proceeding