Pharmacokinetics of Metformin in Patients Receiving Regular Hemodiafiltration
Smith, Felicity C., BMedSci (Hons), Kumar, Shaun S., PhD, Furlong, Timothy J., PhD, Gangaram, Suraj V., BMedSci (Hons), Greenfield, Jerry R., PhD, Stocker, Sophie L., PhD, Graham, Garry G., PhD, Williams, Kenneth M., PhD, Day, Richard O., MD
Published in American journal of kidney diseases (01.12.2016)
Published in American journal of kidney diseases (01.12.2016)
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Journal Article
A SMT-based diagnostic test generation method for combinational circuits
Prabhu, S., Hsiao, M. S., Lingappan, L., Gangaram, V.
Published in 2012 IEEE 30th VLSI Test Symposium (VTS) (01.04.2012)
Published in 2012 IEEE 30th VLSI Test Symposium (VTS) (01.04.2012)
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Conference Proceeding
A Novel SMT-Based Technique for LFSR Reseeding
Prabhu, S., Hsiao, M. S., Lingappan, L., Gangaram, V.
Published in 2012 25th International Conference on VLSI Design (01.01.2012)
Published in 2012 25th International Conference on VLSI Design (01.01.2012)
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Conference Proceeding
An Efficient 2-Phase Strategy to Achieve High Branch Coverage
Prabhu, S., Hsiao, M. S., Krishnamoorthy, S., Lingappan, L., Gangaram, V., Grundy, J.
Published in 2011 Asian Test Symposium (01.11.2011)
Published in 2011 Asian Test Symposium (01.11.2011)
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Conference Proceeding
Efficient RTL Coverage Metric for Functional Test Selection
Jian Kang, Seth, S.C., Gangaram, V.
Published in 25th IEEE VLSI Test Symposium (VTS'07) (01.05.2007)
Published in 25th IEEE VLSI Test Symposium (VTS'07) (01.05.2007)
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Conference Proceeding
Fast Enhancement of Validation Test Sets to Improve Stuck-at Fault Coverage for RTL circuits
Lingappan, L., Gangaram, V., Jha, N.K., Chakravarty, S.
Published in 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) (01.01.2007)
Published in 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) (01.01.2007)
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Conference Proceeding
Upper bounding fault coverage by structural analysis and signal monitoring
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Conference Proceeding
Functional Test Selection for High Volume Manufacturing
Gangaram, V., Bhan, D., Caldwell, J.K.
Published in Seventh International Workshop on Microprocessor Test and Verification (MTV'06) (01.12.2006)
Published in Seventh International Workshop on Microprocessor Test and Verification (MTV'06) (01.12.2006)
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Conference Proceeding
Deriving signal constraints to accelerate sequential test generation
Chakradhar, S.T., Gangaram, V., Rothweiler, S.
Published in Proceedings Tenth International Conference on VLSI Design (1997)
Published in Proceedings Tenth International Conference on VLSI Design (1997)
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Conference Proceeding
Efficient Selection of Observation Points for Functional Tests
Jian Kang, Seth, S.C., Yi-Shing Chang, Gangaram, V.
Published in 9th International Symposium on Quality Electronic Design (isqed 2008) (01.03.2008)
Published in 9th International Symposium on Quality Electronic Design (isqed 2008) (01.03.2008)
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Conference Proceeding