by NG, MEI ZHEN, LEE, BYUNG HOON, GAN, CHEE LIP, ZINN, ALFRED A
Year of Publication 04.08.2016

by LEE, BYUNG HOON, GAN, CHEE LIP, ZINN, ALFRED A, LAM, YENG MING
Year of Publication 04.08.2016

by Mario, Hendro, Meng Keong Lim, Gan, Chee Lip
Published in 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2012)

by I Made, Riko, Gan, Chee Lip, Pey, Kin Leong, Tan, Chuan Seng
Published in Meeting abstracts (Electrochemical Society) (08.07.2010)

by GAN CHEE LIP, KIM JAEWON, ZINN ALFRED A, LI ZHENGGANG, LAM YENG MING
Year of Publication 04.06.2019

by GAN, CHEE LIP, KIM, JAEWON, ZINN, ALFRED A, LAM, YENG MING, LI, ZHENGGANG
Year of Publication 01.06.2018

by Riko, I. M., Pramana, S. S., Rong, E. P. J., Wong Chee Cheong, Chen Zhong, Yoong, A. T. I., Lip, G. C.
Published in 2012 IEEE 14th Electronics Packaging Technology Conference (EPTC) (01.12.2012)

by Lau Fu Long, Riko, I. M., Putra, W. N., Rong, E. P. J., Lim Jun Zhang, Lim Ju Dy, Wong Chee Cheong, Chen Zhong, Nachiappan, V. C., Lip, G. C.
Published in 2012 IEEE 14th Electronics Packaging Technology Conference (EPTC) (01.12.2012)

by GAN CHEE LIP, ZINN ALFRED A, LEE BYUNG HOON, LAM YENG MING
Year of Publication 26.01.2018

by NG MEI ZHEN, GAN CHEE LIP, ZINN ALFRED, LEE BYUNG-HOON
Year of Publication 01.12.2017

by LEE, BYUNG-HOON, GAN, CHEE LIP, ZINN, ALFRED A, LAM, YENG MING
Year of Publication 16.11.2016

by LEE, BYUNG-HOON, NG, MEI ZHEN, GAN, CHEE LIP, ZINN, ALFRED A
Year of Publication 01.11.2016

by Gan, Chee Lip
Published in Electronic device failure analysis (01.02.2011)

by Tam Lyn Tan, Hui Ping Lim, Chee Lip Gan, Nam Hwang
Published in Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005 (2005)

by Chef, Samuel, Chua, Chung Tah, Gan, Chee Lip
Published in Electronic device failure analysis (01.08.2021)

by Alam, S.M., Gan, C.L., Wei, F.L., Thompson, C.V., Troxel, D.E.
Published in IEEE transactions on device and materials reliability (01.09.2005)

by Quah, Alfred C.T., Meng Chua, Choon, Tan, Soon Huat, Koh, Lian Ser, Phang, Jacob C.H., Tan, Tam Lyn, Gan, Chee Lip
Published in Electronic device failure analysis (01.08.2008)