by Gao, Y., Sasangka, W.A., Thompson, C.V., Gan, C.L.
Published in Microelectronics and reliability (01.09.2019)

by Heryanto, A., Putra, W.N., Trigg, A., Gao, S., Kwon, W.S., Che, F.X., Ang, X.F., Wei, J., I Made, R., Gan, C.L., Pey, K.L.
Published in Journal of electronic materials (01.09.2012)

by Syaranamual, G.J., Sasangka, W.A., Made, R.I., Arulkumaran, S., Ng, G.I., Foo, S.C., Gan, C.L., Thompson, C.V.
Published in Microelectronics and reliability (01.09.2016)

by Zhang, H.P., Xia, Q., Wang, B., Yang, L.C., Wu, Y.P., Sun, D.L., Gan, C.L., Luo, H.J., Bebeda, A.W., Ree, T. van
Published in Electrochemistry communications (01.03.2009)

by Wells, J.C., Dudani, S., Gan, C.L., Stukalin, I., Azad, A., Liow, E., Donskov, F., Yuasa, T., Pal, S., De Velasco, G., Wood, L., Hansen, A., Beuselinck, B., Kollmannsberger, C., Powles, T., Mcgregor, B., Duh, M.S., Huynh, L., Heng, D.Y.C.
Published in European urology open science (Online) (01.07.2020)

by Gross, Phoebe L., Gan, Julian C.L., Scurfield, Daniel J., Frank, Cory, Frank, Cedar, McLean, Caelan, Bob, Chris, Moore, Jonathan W.
Published in Frontiers in Marine Science (27.11.2023)

by Gambino, J., Wynne, J., Gill, J., Mongeon, S., Meatyard, D., Lee, B., Bamnolker, H., Hall, L., Li, N., Hernandez, M., Little, P., Hamed, M., Ivanov, I., Gan, C.L.
Published in Microelectronic engineering (01.11.2006)

by Kor, H.B., Liu, Q., Gan, C.L.
Published in 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (20.07.2020)

by Che, Fa Xing, Ong, Yeow Chon, Ng, Hong Wan, Gan, C.L., Kumar, Gokul
Published in Materials science in semiconductor processing (01.09.2024)

by Tay, Y.S., Yang, L., Zhang, H., Kor, H.B., Zhang, L., Liu, H., Gill, V., Lambourne, A., Li, K.H.H., Chen, Z., Gan, C.L.
Published in Microelectronics and reliability (01.11.2023)

by Gan, C.L., Yang, Z., Salahia, G., Halpin, S., Nair, S.
Published in Clinical radiology (01.03.2021)

by Gan, C.L., Meyers, D.E., Stukalin, I., Dudani, S., Dolter, S., Grosjean, H.A.I., Ewanchuk, B.W., Goutam, S., Sander, M., Wells, J.C., Pabani, A., Cheng, T., Yuasa, T., Morris, D., Kanesvaran, R., Pal, S.K., Wood, L.A., Donskov, F., Choueiri, T.K., Heng, D.Y.C.
Published in Annals of oncology (01.11.2020)

by Gan, C.L., Stukalin, I., Meyers, D.E., Dudani, S., Grosjean, H.A.I., Dolter, S., Ewanchuk, B.W., Goutam, S., Sander, M., Wells, J.C., Pabani, A., Cheng, T., Monzon, J., Morris, D., Basappa, N.S., Pal, S.K., Wood, L.A., Donskov, F., Choueiri, T.K., Heng, D.Y.C.
Published in Annals of oncology (01.09.2020)

by Tan, H.T., Gao, Y., Syaranamual, G.J., Sasangka, W.A., Foo, S.C., Lee, K.H., Arulkumaran, S., Ng, G.I., Thompson, C.V., Gan, C.L.
Published in Microelectronics and reliability (01.11.2023)

by Chua, C.T., Ong, H.G., Sanchez, K., Perdu, P., Gan, C.L.
Published in Microelectronics and reliability (01.09.2016)

by Sasangka, W.A., Gao, Y., Gan, C.L., Thompson, C.V.
Published in Microelectronics and reliability (01.09.2018)

by Gan, C.L., O'Sullivan, M.J., Metzler-Baddeley, C., Halpin, S.
Published in Clinical radiology (01.11.2017)

by Sasangka, W.A., Syaranamual, G.J., Gao, Y., I Made, R., Gan, C.L., Thompson, C.V.
Published in Microelectronics and reliability (01.09.2017)

by Chef, S., Jacquir, S., Sanchez, K., Perdu, P., Binczak, S., Gan, C.L.
Published in Microelectronics and reliability (01.08.2015)

by Chua, C.T., Ong, H.G., Sanchez, K., Perdu, P., Gan, C.L.
Published in Microelectronics and reliability (01.09.2016)