Reliability assessment and mechanical characterization of Cu and Au ball bonds in BGA package
Gan, C. L., Hashim, U.
Published in Journal of materials science. Materials in electronics (01.08.2013)
Published in Journal of materials science. Materials in electronics (01.08.2013)
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Journal Article
Influence of shear strength on long term biased humidity reliability of Cu ball bonds
Gan, C. L., Hashim, U.
Published in Journal of materials science. Materials in electronics (01.11.2014)
Published in Journal of materials science. Materials in electronics (01.11.2014)
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Journal Article
Technical Barriers and Development of Cu Wirebonding in Nanoelectronics Device Packaging
Hashim, U., Chan, B. L., Ng, E. K., Gan, C. L., Classe, F. C.
Published in Journal of nanomaterials (01.01.2012)
Published in Journal of nanomaterials (01.01.2012)
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Journal Article
Effects of 3,5-bis(trifluoromethyl)benzeneboronic acid as an additive on electrochemical performance of propylene carbonate-based electrolytes for lithium ion batteries
Wang, B., Qu, Q.T., Xia, Q., Wu, Y.P., Li, X., Gan, C.L., van Ree, T.
Published in Electrochimica acta (30.12.2008)
Published in Electrochimica acta (30.12.2008)
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Journal Article
Self-aligned metal capping layers for copper interconnects using electroless plating
Gambino, J., Wynne, J., Gill, J., Mongeon, S., Meatyard, D., Lee, B., Bamnolker, H., Hall, L., Li, N., Hernandez, M., Little, P., Hamed, M., Ivanov, I., Gan, C.L.
Published in Microelectronic engineering (01.11.2006)
Published in Microelectronic engineering (01.11.2006)
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Journal Article
Conference Proceeding
Study on Cu Protrusion of Through-Silicon Via
Che, F. X., Putra, W. N., Heryanto, A., Trigg, Alastair, Zhang, Xiaowu, Gan, C. L.
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01.05.2013)
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01.05.2013)
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Journal Article
Electrical behavior of Au–Ge eutectic solder under aging for solder bump application in high temperature Electronics
Lau, F.L., I Made, Riko, Putra, W.N., Lim, J.Z., Nachiappan, V.C., Aw, J.L., Gan, C.L.
Published in Microelectronics and reliability (01.09.2013)
Published in Microelectronics and reliability (01.09.2013)
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Journal Article
Conference Proceeding
Bidirectional electromigration failure
Lim, M.K., Chouliaras, V.A., Gan, C.L., Dwyer, V.M.
Published in Microelectronics and reliability (01.09.2013)
Published in Microelectronics and reliability (01.09.2013)
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Journal Article
Conference Proceeding
Effect of Copper TSV Annealing on Via Protrusion for TSV Wafer Fabrication
Heryanto, A., Putra, W.N., Trigg, A., Gao, S., Kwon, W.S., Che, F.X., Ang, X.F., Wei, J., I Made, R., Gan, C.L., Pey, K.L.
Published in Journal of electronic materials (01.09.2012)
Published in Journal of electronic materials (01.09.2012)
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Journal Article
Investigation on Data Retrieval in Emerging Non-Volatile Memory Devices Using Conductive Probe Atomic Force Microscopy
Tay, J. Y., Cheah, J., Chef, S., Zeng, X. M., Liu, Q., Gan, C. L
Published in 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (24.07.2023)
Published in 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (24.07.2023)
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Conference Proceeding
Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization
Infante, F., Perdu, P., Kor, H.B., Gan, C.L., Lewis, D.
Published in Microelectronics and reliability (01.09.2011)
Published in Microelectronics and reliability (01.09.2011)
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Journal Article
Conference Proceeding