by Rech, P., Galliere, J.-M., Girard, P., Griffoni, A., Boch, J., Wrobel, F., Saigne, F., Dilillo, L.
Published in IEEE transactions on nuclear science (01.08.2012)

by Galliere, J.-M, Boch, J.
Published in 2013 IEEE International Conference on Microelectronic Systems Education (MSE) (01.06.2013)

by Chancel, G., Galliere, J.-M., Maurine, P.
Published in 2023 Workshop on Fault Detection and Tolerance in Cryptography (FDTC) (10.09.2023)

by Chancel, G., Galliere, J. M., Maurine, P.
Published in 2022 Workshop on Fault Detection and Tolerance in Cryptography (FDTC) (01.09.2022)

by Toulemont, J., Chancel, G., Galliere, J. M., Mailly, F., Nouet, P., Maurine, P.
Published in 2021 Workshop on Fault Detection and Tolerance in Cryptography (FDTC) (01.09.2021)

by Pantel, D., Vaille, J.-R, Wrobel, F., Dilillo, L., Galliere, J.-M, Autran, J.-L, Cocquerez, P., Chadoutaud, P., Saigne, F.
Published in 2012 18th IEEE-NPSS Real Time Conference (01.06.2012)

by Rech, P, Galliere, J-M, Girard, P, Wrobel, F, Saigne, F, Dilillo, L
Published in IEEE transactions on nuclear science (01.06.2011)

by Bouchakour, R., Portal, J.M., Gallière, J.M., Azais, F., Bertrand, Y., Renovell, M.
Published in Microelectronic engineering (01.04.2004)

by Pantel, D, Vaille, J R, Wrobel, F, Dilillo, L, Galliere, J M, Autran, J L, Cocquerez, P, Chadoutaud, P, Saigne, F
Published in Journal of instrumentation (01.05.2012)

by Renovell, M, Gallière, Jm, Azaïs, F, Bertrand, Y
Published in Journal of electronic testing (01.08.2003)

by Chancel, G., Galliere, J.-M., Maurine, P.
Published in Constructive Side-Channel Analysis and Secure Design

by Dilillo, L., Rech, P., Galliere, J.-M, Girard, P., Wrobel, F., Saigne, F.
Published in 2011 12th Latin American Test Workshop (LATW) (01.03.2011)

by Rech, P., Galliere, J.-M, Girard, P., Griffoni, A., Boch, J., Wrobel, F., Saigne, F., Dilillo, L.
Published in 2011 12th European Conference on Radiation and Its Effects on Components and Systems (01.09.2011)

by Polian, I., Sandip, Kundu, Galliere, Jean-Marc J.-M., Engelke, P., Renovell, Michel, Becker, P.
Year of Publication 2005

by Galliere, J., Dilillo, L.
Published in 2011 IEEE International Conference on Microelectronic Systems Education (01.06.2011)

by Renovell, M., Galliere, J.M., Azais, F., Bertrand, Y.
Published in Proceedings International Test Conference 2001 (Cat. No.01CH37260) (2001)

by Dilillo, L., Wrobel, F., Galliere, J.-M., Saigne, F.
Published in 2009 3rd International Workshop on Advances in sensors and Interfaces (01.06.2009)

by Galliere, J.-M., Boch, J.
Published in 2009 IEEE International Conference on Microelectronic Systems Education (01.07.2009)

by Galliere, J.-M., Papet, P., Latorre, L.
Published in 2008 IEEE International Behavioral Modeling and Simulation Workshop (01.09.2008)

by Galli re, J. M., Renovell, M., Aza s, F., Bertrand, Y.
Published in Journal of computer science and technology (01.03.2005)