Evaluation of Total Ionizing Dose Effects on Commercial FRAMs
Slimani, Mariem, Armani, Jean-Marc, Gaillard, Remi
Published in 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) (01.07.2018)
Published in 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) (01.07.2018)
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Conference Proceeding
Simplified SEE Sensitivity Screening for COTS Components in Space
Garcia Alia, Ruben, Brugger, Markus, Daly, Eamonn, Danzeca, Salvatore, Ferlet-Cavrois, Veronique, Gaillard, Remi, Mekki, Julien, Poivey, Christian, Zadeh, Ali
Published in IEEE transactions on nuclear science (01.02.2017)
Published in IEEE transactions on nuclear science (01.02.2017)
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Journal Article
SEL Hardness Assurance in a Mixed Radiation Field
Alia, Ruben Garcia, Brugger, Markus, Danzeca, Salvatore, Ferlet-Cavrois, Veronique, Frost, Christopher, Gaillard, Remi, Mekki, Julien, Saigne, Frederic, Thornton, Adam, Uznanski, Slawosz, Wrobel, Frederic
Published in IEEE transactions on nuclear science (01.12.2015)
Published in IEEE transactions on nuclear science (01.12.2015)
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Journal Article
Ultraenergetic Heavy-Ion Beams in the CERN Accelerator Complex for Radiation Effects Testing
Alia, Ruben Garcia, Fernandez Martinez, Pablo, Kastriotou, Maria, Brugger, Markus, Bernhard, Johannes, Cecchetto, Matteo, Cerutti, Francesco, Charitonidis, Nikolaos, Danzeca, Salvatore, Gatignon, Lau, Gerbershagen, Alexander, Gilardoni, Simone, Kerboub, Nourdine, Tali, Maris, Wyrwoll, Vanessa, Ferlet-Cavrois, Veronique, Boatella Polo, Cesar, Evans, Hugh, Furano, Gianluca, Gaillard, Remi
Published in IEEE transactions on nuclear science (01.01.2019)
Published in IEEE transactions on nuclear science (01.01.2019)
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Journal Article
Direct Ionization Impact on Accelerator Mixed-Field Soft-Error Rate
Alia, Ruben Garcia, Gilardoni, Simone, Infantino, Angelo, Kastriotou, Maria, Kerboub, Nourdine, Lerner, Giuseppe, Wyrwoll, Vanessa, Ferlet-Cavrois, Veronique, Boatella, Cesar, Javanainen, Arto, Kettunen, Heikki, Tali, Maris, Morilla, Yolanda, Martin-Holgado, Pedro, Gaillard, Remi, Wrobel, Frederic, Cazzaniga, Carlo, Alexandrescu, Dan, Glorieux, Maximilien, Puchner, Helmut, Brugger, Markus, Cecchetto, Matteo, Cerutti, Francesco, Cononetti, Andrea, Danzeca, Salvatore, Esposito, Luigi, Fernandez-Martinez, Pablo
Published in IEEE transactions on nuclear science (01.01.2020)
Published in IEEE transactions on nuclear science (01.01.2020)
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Journal Article
Single Event Effects in MEMS Accelerometers
Oudea, C., Poirot, P., Gaillard, R., Poivey, C., Marchand, L.
Published in 2009 IEEE Radiation Effects Data Workshop (01.07.2009)
Published in 2009 IEEE Radiation Effects Data Workshop (01.07.2009)
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Conference Proceeding
SEL Cross Section Energy Dependence Impact on the High Energy Accelerator Failure Rate
Alia, Ruben Garcia, Blackmore, Ewart W., Brugger, Markus, Danzeca, Salvatore, Ferlet-Cavrois, Veronique, Gaillard, Remi, Mekki, Julien, Poivey, Christian, Roed, Ketil, Saigne, Frederic, Spiezia, Giovanni, Trinczek, Michael, Uznanski, Slawosz, Wrobel, Frederic
Published in IEEE transactions on nuclear science (01.12.2014)
Published in IEEE transactions on nuclear science (01.12.2014)
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Journal Article
Methods for Proton Direct Ionization SEU Characterization and Orbital Error-Rate Estimation
Glorieux, Maximilien, Bonnoit, Thierry, Lange, Thomas, Gaillard, Remi, Nofal, Issam, Artola, Laurent, Poivey, Christian, Levacq, David, Rey, Romain, Heikki, Kettunen, Polo, Cesar Boatella
Published in IEEE transactions on nuclear science (01.08.2024)
Published in IEEE transactions on nuclear science (01.08.2024)
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Journal Article
The Effect of Proton Energy on SEU Cross Section of a 16 Mbit TFT PMOS SRAM with DRAM Capacitors
Uznanski, Slawosz, Alia, Ruben Garcia, Blackmore, Ewart, Brugger, Markus, Gaillard, Remi, Mekki, Julien, Todd, Benjamin, Trinczek, Michael, Villanueva, Andrea Vilar
Published in IEEE transactions on nuclear science (01.12.2014)
Published in IEEE transactions on nuclear science (01.12.2014)
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Journal Article
SEE Tests With Ultra Energetic Xe Ion Beam in the CHARM Facility at CERN
Fernandez-Martinez, Pablo, Alia, Ruben Garcia, Cecchetto, Matteo, Kastriotou, Maria, Kerboub, Nourdine, Tali, Maris, Wyrwoll, Vanessa, Brugger, Markus, Cangialosi, Chiara, Cerutti, Francesco, Danzeca, Salvatore, Delrieux, Marc, Froeschl, Robert, Gatignon, Lau, Gilardoni, Simone, Lendaro, Jerome, Mateu, Isidre, Ravotti, Federico, Wilkens, Henric, Gaillard, Remi
Published in IEEE transactions on nuclear science (01.07.2019)
Published in IEEE transactions on nuclear science (01.07.2019)
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Journal Article
SEB Characterization of Commercial Power MOSFETs With Backside Laser and Heavy Ions of Different Ranges
Luu, A., Miller, F., Poirot, P., Gaillard, R., Buard, N., Carriere, T., Austin, P., Bafleur, M., Sarrabayrouse, G.
Published in IEEE transactions on nuclear science (01.08.2008)
Published in IEEE transactions on nuclear science (01.08.2008)
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Journal Article
Sub-LET Threshold SEE Cross Section Dependency With Ion Energy
Alia, Ruben Garcia, Bahamonde, Cristina, Brandenburg, Sytze, Brugger, Markus, Daly, Eamonn, Ferlet-Cavrois, Veronique, Gaillard, Remi, Hoeffgen, Stefan, Menicucci, Alessandra, Metzger, Stefan, Zadeh, Ali, Muschitiello, Michele, Noordeh, Emil, Santin, Giovanni
Published in IEEE transactions on nuclear science (01.12.2015)
Published in IEEE transactions on nuclear science (01.12.2015)
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Journal Article
Sensitive Volume and Triggering Criteria of SEB in Classic Planar VDMOS
Luu, A, Austin, P, Miller, F, Buard, N, Carrière, Thierry, Poirot, P, Gaillard, R, Bafleur, M, Sarrabayrouse, G
Published in IEEE transactions on nuclear science (01.08.2010)
Published in IEEE transactions on nuclear science (01.08.2010)
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Journal Article
Investigation of Thermal Neutron Induced Soft Error Rates in Commercial Srams with 0.35 μm to 90 nm Technologies
Olmos, M., Gaillard, R., Van Overberghe, A., Beaucour, J., ShiJie Wen, Sung Chung
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.03.2006)
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.03.2006)
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Conference Proceeding
SEE Testing on commercial power MOSFETs
Fernandez-Martinez, Pablo, Papadopoulou, Athina, Danzeca, Salvatore, Foucard, Gilles, Garcia Alia, Ruben, Kastriotou, Maria, Cazzaniga, Carlo, Tsiligiannis, Giorgos, Gaillard, Remi
Published in 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.10.2020)
Published in 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.10.2020)
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Conference Proceeding
Who Decides?
Anderson, Ivy, DeSart, Mel, Cheng Ean, Lee, Gaillard, Remi, Gibbons, Susan, Huftalen, Adam, Lippincott, Joan, Mele, Salvatore, Schimmer, Ralf, Stine, Deborah, Vaughan, John
Published in Open Scholarship Initiative Proceedings (22.04.2016)
Published in Open Scholarship Initiative Proceedings (22.04.2016)
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Journal Article
Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node
Leroy, D., Gaillard, R., Schaefer, E., Beltrando, C., Shi-Jie Wen, Wong, R.
Published in 2008 14th IEEE International On-Line Testing Symposium (01.07.2008)
Published in 2008 14th IEEE International On-Line Testing Symposium (01.07.2008)
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Conference Proceeding