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Miniature probe station for Hall test of high-purity germanium single crystal and test method
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High-purity germanium single crystal Hall test sample wafer and method for preparing high-purity germanium single crystal Hall test sample wafer by adopting zone melting method
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Year of Publication 03.06.2022
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Log data storage method based on intelligent security management platform
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Year of Publication 20.12.2022
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Year of Publication 20.12.2022
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