Showing
1 - 20
results of
85
for search '
"GUO Jyh-Chyurn"
'
Skip to content
Portal K.UTB
Čeština
Login
TBU Catalog
e-resources
E-THESES
All Fields
Title
Author
Subject
Find
Advanced Search
Search Results - "GUO Jyh-Chyurn"
Showing
1 - 20
results of
85
for search '
"GUO Jyh-Chyurn"
'
, query time: 1.42s
Refine Results
Sort
Relevance
Date Descending
Date Ascending
1
Loading…
Narrow-Width Effect on High-Frequency Performance and RF Noise of Sub-40-nm Multifinger nMOSFETs and pMOSFETs
by
YEH, Kuo-Liang
,
GUO, Jyh-Chyurn
Published in
IEEE transactions on electron devices
(01.01.2013)
Get full text
Journal Article
Save to List
Saved in:
2
Loading…
A New Three-Dimensional Capacitor Model for Accurate Simulation of Parasitic Capacitances in Nanoscale MOSFETs
by
GUO, Jyh-Chyurn
,
YEH, Chih-Ting
Published in
IEEE transactions on electron devices
(01.08.2009)
Get full text
Journal Article
Save to List
Saved in:
3
Loading…
A New Method for Layout-Dependent Parasitic Capacitance Analysis and Effective Mobility Extraction in Nanoscale Multifinger MOSFETs
by
YEH, Kuo-Liang
,
GUO, Jyh-Chyurn
Published in
IEEE transactions on electron devices
(01.09.2011)
Get full text
Journal Article
Save to List
Saved in:
4
Loading…
A Broadband and Scalable Lossy Substrate Model for RF Noise Simulation and Analysis in Nanoscale MOSFETs With Various Pad Structures
by
GUO, Jyh-Chyum
,
TSAI, Yi-Hsiu
Published in
IEEE transactions on microwave theory and techniques
(01.02.2009)
Get full text
Journal Article
Save to List
Saved in:
5
Loading…
A new lossy substrate de-embedding method for sub-100 nm RF CMOS noise extraction and modeling
by
GUO, Jyh-Chyum
,
LIN, Yi-Min
Published in
IEEE transactions on electron devices
(01.02.2006)
Get full text
Journal Article
Save to List
Saved in:
6
Loading…
A Compact RF CMOS Modeling for Accurate High-Frequency Noise Simulation in Sub-100-nm MOSFETs
by
Guo, Jyh-Chyurn
,
Lin, Yi-Min
Published in
IEEE transactions on computer-aided design of integrated circuits and systems
(01.09.2008)
Get full text
Journal Article
Save to List
Saved in:
7
Loading…
A Broadband and Scalable On-Chip Inductor Model Appropriate for Operation Modes of Varying Substrate Resistivities
by
GUO, Jyh-Chyurn
,
TAN, Teng-Yang
Published in
IEEE transactions on electron devices
(01.11.2007)
Get full text
Journal Article
Save to List
Saved in:
8
Loading…
Layout-Dependent Stress Effect on High-Frequency Characteristics and Flicker Noise in Multifinger and Donut MOSFETs
by
YEH, Kuo-Liang
,
GUO, Jyh-Chyurn
Published in
IEEE transactions on electron devices
(01.09.2011)
Get full text
Journal Article
Save to List
Saved in:
9
Loading…
The Impact of Layout Dependent Intrinsic Parasitic RLC on High Frequency Performance in 3T and 4T Multi-finger nMOSFETs
by
Jyh
-
Chyurn Guo
,
Jyun-Rong Ou
,
Jinq-Min Lin
Published in
2019 IEEE MTT-S International Microwave Symposium (IMS)
(01.06.2019)
Get full text
Conference Proceeding
Save to List
Saved in:
10
Loading…
The Impact of Layout-Dependent STI Stress and Effective Width on Low-Frequency Noise and High-Frequency Performance in Nanoscale nMOSFETs
by
YEH, Kuo-Liang
,
GUO, Jyh-Chyurn
Published in
IEEE transactions on electron devices
(01.11.2010)
Get full text
Journal Article
Save to List
Saved in:
11
Loading…
A New Lossy Substrate Model for Accurate RF CMOS Noise Extraction and Simulation With Frequency and Bias Dependence
by
GUO, Jyh-Chyum
,
LIN, Yi-Min
Published in
IEEE transactions on microwave theory and techniques
(01.11.2006)
Get full text
Journal Article
Save to List
Saved in:
12
Loading…
Layout Optimization and Parasitic Reduction in Sub-60-nm nMOSFETs for Super-350-GHz fMAX
by
Guo
,
Jyh
-
Chyurn
,
Ou, Jyun-Rong
Published in
IEEE transactions on electron devices
(01.07.2022)
Get full text
Journal Article
Save to List
Saved in:
13
Loading…
A Broadband and Scalable Lumped Element Model for Fully Symmetric Inductors Under Single-Ended and Differentially Driven Operations
by
GUO, Jyh-Chyum
,
TAN, Teng-Yang
Published in
IEEE transactions on electron devices
(01.08.2007)
Get full text
Journal Article
Save to List
Saved in:
14
Loading…
A broadband and scalable model for on-chip inductors incorporating substrate and conductor loss effects
by
GUO, Jyh-Chyum
,
TAN, Teng-Yang
Published in
IEEE transactions on electron devices
(01.03.2006)
Get full text
Journal Article
Save to List
Saved in:
15
Loading…
SiC Strained nMOSFETs With Enhanced High- Frequency Performance and Impact on Flicker Noise and Random Telegraph Noise
by
Guo
,
Jyh
-
Chyurn
,
Chang, Chih-Shiang
Published in
IEEE transactions on microwave theory and techniques
(01.06.2020)
Get full text
Journal Article
Save to List
Saved in:
16
Loading…
Analytical modeling of proximity and skin effects for millimeter-wave inductors simulation and design in nano Si CMOS
by
Chan, R.-J.
,
Guo, J.-C.
Published in
2014 IEEE MTT-S International Microwave Symposium (IMS2014)
(01.06.2014)
Get full text
Conference Proceeding
Save to List
Saved in:
17
Loading…
The impact of layout dependent effects on mobility and flicker noise in nanoscale multifinger nMOSFETs for RF and analog design
by
Jyh
-
Chyurn Guo
,
Yi-Zen Lo
,
Jyun-Rong Ou
Published in
2016 IEEE MTT-S International Microwave Symposium (IMS)
(01.05.2016)
Get full text
Conference Proceeding
Save to List
Saved in:
18
Loading…
The impact of layout dependent stress and gate resistance on high frequency performance and noise in multifinger and donut MOSFETs
by
Chih-You Ku
,
Kuo-Ling Yeh
,
Jyh
-
Chyurn Guo
Published in
2013 IEEE MTT-S International Microwave Symposium Digest (MTT)
(01.06.2013)
Get full text
Conference Proceeding
Save to List
Saved in:
19
Loading…
The Impact of Uni-axial Strain on Low Frequency Noise in Nanoscale p-Channel Metal--Oxide--Semiconductor Field Effect Transistors under Dynamic Body Biases
by
Yeh, Kuo-Liang
,
Ku, Chih-You
,
Guo
,
Jyh
-
Chyurn
Published in
Japanese Journal of Applied Physics
(01.08.2010)
Get full text
Journal Article
Save to List
Saved in:
20
Loading…
A New Method for Accurate Extraction of Source Resistance and Effective Mobility in Nanoscale Multifinger nMOSFETs
by
Guo, Jyh-Chyrun
,
Lo, Yi-Zen
Published in
IEEE transactions on electron devices
(01.09.2015)
Get full text
Journal Article
Save to List
Saved in:
1
2
3
4
5
Next
[5]
RSS Feed
Email Search
Save Search
Search History
Back
Refine Results
Page will reload when a filter is selected or excluded.
Limit to articles from scholarly journals
Limit to articles with full text available
Limit to Open Access content
Exclude newspaper articles
Include articles at other libraries
Expand results using synonyms
Format
Journal Article
33 results
33
Conference Proceeding
29 results
29
Patent
22 results
22
Magazine Article
1 results
1
Subject Area
engineering
57 results
57
physics
28 results
28
applied sciences
18 results
18
chemistry
5 results
5
economics
5 results
5
medicine
5 results
5
See more
Topic
science & technology
39 results
39
engineering
36 results
36
engineering, electrical & electronic
36 results
36
technology
36 results
36
physics
28 results
28
physical sciences
25 results
25
See more
Language
English
85 results
85
Chinese
1 results
1
Japanese
1 results
1
Year of Publication
From:
To:
Database
IEEE Electronic Library Online
59 results
59
USPTO Issued Patents
14 results
14
esp@cenet
5 results
5
USPTO Published Applications
3 results
3
AUTh Library subscriptions: IOP Publishing
3 results
3
ScienceDirect Freedom Collection 2013
1 results
1
See more