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"GUNDA ARUN K"
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"GUNDA ARUN K"
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SYSTEM AND DEVICE FOR REDUCING INSTANTANEOUS VOLTAGE DROOP DURING A SCAN SHIFT OPERATION
by
GOEL SANDEEP KUMAR
,
DEVTA PRASANNA NARENDRA
,
GUNDA ARUN K
Year of Publication
27.10.2011
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System and device for reducing instantaneous voltage droop during a scan shift operation
by
GOEL SANDEEP KUMAR
,
DEVTA-PRASANNA NARENDRA
,
GUNDA ARUN K
Year of Publication
07.01.2014
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SYSTEM AND DEVICE FOR REDUCING INSTANTANEOUS VOLTAGE DROOP DURING SCAN SHIFT OPERATION
by
SUNDEEP KUMAR GAUL
,
ARUN K GUNDA
,
NARENDRA DEVTA-PRASANNA
Year of Publication
01.08.2013
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SYSTEM AND DEVICE FOR REDUCING INSTANTANEOUS VOLTAGE DROOP DURING SCAN SHIFT OPERATION
by
SUNDEEP KUMAR GAUL
,
ARUN K GUNDA
,
NARENDRA DEVTA-PRASANNA
Year of Publication
10.11.2011
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Reducing instantaneous voltage droop during a scan shift operation
by
GOEL, SANDEEP KUMAR
,
GUNDA
,
ARUN K
,
DEVTA PRASANNA, NARENDRA
Year of Publication
09.11.2011
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SYSTEM AND DEVICE FOR REDUCING INSTANTANEOUS VOLTAGE DROOP DURING A SCAN SHIFT OPERATION
by
GOEL SANDEEP KUMAR
,
DEVTA-PRASANNA NARENDRA
,
GUNDA ARUN K
Year of Publication
27.10.2011
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Testing a circuit with compressed scan chain subsets
by
Goyal, Saket K
,
Nguyen, Thai Minh
,
Gunda
,
Arun K
Year of Publication
09.11.2010
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Testing a circuit with compressed scan chain subsets
by
GOYAL SAKET K
,
NGUYEN THAI MINH
,
GUNDA ARUN K
Year of Publication
09.11.2010
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TESTING A CIRCUIT WITH COMPRESSED SCAN CHAIN SUBSETS
by
GOYAL SAKET K
,
NGUYEN THAI MINH
,
GUNDA ARUN K
Year of Publication
23.04.2009
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System and device for reducing instantaneous voltage droop during a scan shift operation
by
DEVTA-PRASANNA, NARENDRA
,
GOEL, SANDEEP KUMAR
,
GUNDA
,
ARUN K
Year of Publication
21.03.2014
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Method of analyzing static current test vectors with reduced file sizes for semiconductor integrated circuits
by
GHOSH PRADIPTA
,
GUNDA ARUN K
,
HUSSAIN HUNAID
Year of Publication
10.09.2002
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Method of analyzing static current test vectors with reduced file sizes for semiconductor integrated circuits
by
Hussain, Hunaid
,
Ghosh, Pradipta
,
Gunda
,
Arun K
Year of Publication
10.09.2002
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System and device for reducing instantaneous voltage droop during scan shift operation
by
GOEL SANDEEP KUMAR
,
DEVTA PRASANNA NARENDRA
,
GUNDA ARUN K
Year of Publication
30.10.2013
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System and device for reducing instantaneous voltage droop during a scan shift operation
by
DEVTA-PRASANNA, NARENDRA
,
GOEL, SANDEEP KUMAR
,
GUNDA
,
ARUN K
Year of Publication
16.11.2011
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System and device for reducing instantaneous voltage droop during a scan shift operation
by
GOEL SANDEEP KUMAR
,
DEVTA PRASANNA NARENDRA
,
GUNDA ARUN K
Year of Publication
09.11.2011
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Defect isolation using scan-path testing and electron beam probing in multi-level high density asics
by
PRASAD; SHARAD
,
DE; KAUSHIK
,
GUNDA
;
ARUN K
,
LINDBERG; GRANT A
Year of Publication
02.09.1997
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