Dipeptidyl peptidase 4 inhibitor sitagliptin protected against dextran sulfate sodium-induced experimental colitis by potentiating the action of GLP-2
Ning, Meng-meng, Yang, Wen-ji, Guan, Wen-bo, Gu, Yi-pei, Feng, Ying, Leng, Ying
Published in Acta pharmacologica Sinica (01.11.2020)
Published in Acta pharmacologica Sinica (01.11.2020)
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Journal Article
Deep-learning-based analysis of preoperative MRI predicts microvascular invasion and outcome in hepatocellular carcinoma
Sun, Bao-Ye, Gu, Pei-Yi, Guan, Ruo-Yu, Zhou, Cheng, Lu, Jian-Wei, Yang, Zhang-Fu, Pan, Chao, Zhou, Pei-Yun, Zhu, Ya-Ping, Li, Jia-Rui, Wang, Zhu-Tao, Gao, Shan-Shan, Gan, Wei, Yi, Yong, Luo, Ye, Qiu, Shuang-Jian
Published in World journal of surgical oncology (08.06.2022)
Published in World journal of surgical oncology (08.06.2022)
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Journal Article
Experimental investigation of the reliability issue of RRAM based on high resistance state conduction
Zhang, Lijie, Hsu, Yen-Ya, Chen, Frederick T, Lee, Heng-Yuan, Chen, Yu-Sheng, Chen, Wei-Su, Gu, Pei-Yi, Liu, Wen-Hsing, Wang, Shun-Min, Tsai, Chen-Han, Huang, Ru, Tsai, Ming-Jinn
Published in Nanotechnology (24.06.2011)
Published in Nanotechnology (24.06.2011)
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A new mechanism of thyroid hormone receptor β agonists ameliorating nonalcoholic steatohepatitis by inhibiting intestinal lipid absorption via remodeling bile acid profiles
Sun, Kai, Zhu, Nan-lin, Huang, Su-ling, Qu, Hui, Gu, Yi-pei, Qin, Li, Liu, Jia, Leng, Ying
Published in Acta pharmacologica Sinica (01.10.2024)
Published in Acta pharmacologica Sinica (01.10.2024)
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Journal Article
TGR5 agonist inhibits intestinal epithelial cell apoptosis via cAMP/PKA/c-FLIP/JNK signaling pathway and ameliorates dextran sulfate sodium-induced ulcerative colitis
Yang, Wen-ji, Han, Fang-hui, Gu, Yi-pei, Qu, Hui, Liu, Jia, Shen, Jian-hua, Leng, Ying
Published in Acta pharmacologica Sinica (01.08.2023)
Published in Acta pharmacologica Sinica (01.08.2023)
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Journal Article
Novel Defects-Trapping TaOX/HfOX RRAM With Reliable Self-Compliance, High Nonlinearity, and Ultra-Low Current
CHEN, Yu-Sheng, LEE, Heng-Yuan, CHEN, Frederick, TSAI, Ming-Jinn, KU, Tzu-Kun, CHEN, Pang-Shiu, CHEN, Wei-Su, TSAI, Kan-Hsueh, GU, Pei-Yi, WU, Tai-Yuan, TSAI, Chen-Han, RAHAMAN, S. Z, LIN, Yu-De
Published in IEEE electron device letters (01.02.2014)
Published in IEEE electron device letters (01.02.2014)
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Journal Article
Resistance instabilities in a filament-based resistive memory
Chen, F. T., Heng-Yuan Lee, Yu-Sheng Chen, Rahaman, S. Z., Chen-Han Tsai, Kan-Hsueh Tsai, Tai-Yuan Wu, Wei-Su Chen, Pei-Yi Gu, Yu-De Lin, Shyh-Shyuan Sheu, Ming-Jinn Tsai, Li-Heng Lee, Tzu-Kun Ku, Pang-Shiu Chen
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
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Conference Proceeding
Robust High-Resistance State and Improved Endurance of HfOX Resistive Memory by Suppression of Current Overshoot
CHEN, Yu-Sheng, LEE, Heng-Yuan, TSAI, Ming-Jinn, LIEN, Chenhsin, CHEN, Pang-Shiu, LIU, Wen-Hsing, WANG, Sum-Min, GU, Pei-Yi, HSU, Yen-Ya, TSAI, Chen-Han, CHEN, Wei-Su, CHEN, Frederick
Published in IEEE electron device letters (01.11.2011)
Published in IEEE electron device letters (01.11.2011)
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A 4Mb embedded SLC resistive-RAM macro with 7.2ns read-write random-access time and 160ns MLC-access capability
Shyh-Shyuan Sheu, Meng-Fan Chang, Ku-Feng Lin, Che-Wei Wu, Yu-Sheng Chen, Pi-Feng Chiu, Chia-Chen Kuo, Yih-Shan Yang, Pei-Chia Chiang, Wen-Pin Lin, Che-He Lin, Heng-Yuan Lee, Pei-Yi Gu, Sum-Min Wang, Chen, F T, Keng-Li Su, Chen-Hsin Lien, Kuo-Hsing Cheng, Hsin-Tun Wu, Tzu-Kun Ku, Ming-Jer Kao, Ming-Jinn Tsai
Published in 2011 IEEE International Solid-State Circuits Conference (01.02.2011)
Published in 2011 IEEE International Solid-State Circuits Conference (01.02.2011)
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Conference Proceeding
Good Endurance and Memory Window for Ti/HfOx Pillar RRAM at 50-nm Scale by Optimal Encapsulation Layer
CHEN, Yu-Sheng, LEE, Heng-Yuan, LIEN, Chenhsin, CHEN, Pang-Shiu, GU, Pei-Yi, LIU, Wen-Hsing, CHEN, Wei-Su, HSU, Yen-Ya, TSAI, Chen-Han, CHEN, Frederick, TSAI, Ming-Jinn
Published in IEEE electron device letters (01.03.2011)
Published in IEEE electron device letters (01.03.2011)
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Journal Article
Impacts of device architecture and low current operation on resistive switching of HfOx nanoscale devices
Chen, Pang-Shiu, Chen, Yu-Sheng, Lee, Heng-Yuan, Wu, Tai-Yuan, Tsai, Kan-Hsueh, Gu, Pei-Yi, Chen, Wei-Su, Tsai, Chen-Han, Chen, Frederick, Tsai, Ming-Jinn
Published in Microelectronic engineering (01.05.2013)
Published in Microelectronic engineering (01.05.2013)
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Journal Article
Improved endurance in ultrathin Al2O3 film with a reactive Ti layer based resistive memory
Chen, Pang-Shiu, Chen, Yu-Sheng, Lee, Heng-Yuan, Liu, Wenshing, Gu, Pei-Yi, Chen, Frederick, Tsai, Ming-Jinn
Published in Solid-state electronics (01.11.2012)
Published in Solid-state electronics (01.11.2012)
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Conference Proceeding
AlOx-Based Resistive Switching Device with Gradual Resistance Modulation for Neuromorphic Device Application
Yi Wu, Shimeng Yu, Wong, H.-S Philip, Yu-Sheng Chen, Heng-Yuan Lee, Sum-Min Wang, Pei-Yi Gu, Chen, F., Ming-Jinn Tsai
Published in 2012 4th IEEE International Memory Workshop (01.05.2012)
Published in 2012 4th IEEE International Memory Workshop (01.05.2012)
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Conference Proceeding
Novel Defects-Trapping / RRAM With Reliable Self-Compliance, High Nonlinearity, and Ultra-Low Current
Yu-Sheng Chen, Heng-Yuan Lee, Pang-Shiu Chen, Wei-Su Chen, Kan-Hsueh Tsai, Pei-Yi Gu, Tai-Yuan Wu, Chen-Han Tsai, Rahaman, S. Z., Yu-De Lin, Chen, Frederick, Ming-Jinn Tsai, Tzu-Kun Ku
Published in IEEE electron device letters (01.02.2014)
Published in IEEE electron device letters (01.02.2014)
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Journal Article
Impact of self-complementary resistance switch induced by over-reset energy on the memory reliability of hafnium oxide based resistive random access memory
Lee, Heng Yuan, Chen, Yu Sheng, Chen, Pang Shiu, Tsai, Chen Han, Gu, Pei Yi, Wu, Tai Yuan, Tsai, Kan Hseuh, Rahaman, Shakh Ziaur, Chen, Wei Su, Chen, Frederick, Tsai, Ming-Jing, Lee, Ming Hung, Ku, Tzu Kun
Published in Japanese Journal of Applied Physics (01.08.2014)
Published in Japanese Journal of Applied Physics (01.08.2014)
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Journal Article
Robust High-Resistance State and Improved Endurance of \hbox Resistive Memory by Suppression of Current Overshoot
Yu-Sheng Chen, Heng-Yuan Lee, Pang-Shiu Chen, Wen-Hsing Liu, Sum-Min Wang, Pei-Yi Gu, Yen-Ya Hsu, Chen-Han Tsai, Wei-Su Chen, Chen, F., Ming-Jinn Tsai, Chenhsin Lien
Published in IEEE electron device letters (01.11.2011)
Published in IEEE electron device letters (01.11.2011)
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Journal Article
Good Endurance and Memory Window for \hbox Pillar RRAM at 50-nm Scale by Optimal Encapsulation Layer
Yu-Sheng Chen, Heng-Yuan Lee, Pang-Shiu Chen, Pei-Yi Gu, Wen-Hsing Liu, Wei-Su Chen, Yen-Ya Hsu, Chen-Han Tsai, Chen, Frederick, Ming-Jinn Tsai, Chenhsin Lien
Published in IEEE electron device letters (01.03.2011)
Published in IEEE electron device letters (01.03.2011)
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Journal Article
Effect of Ti buffer layer on HfOx-based bipolar and complementary resistive switching for future memory applications
Rahaman, Sk Ziaur, Yu-De Lin, Pei-Yi Gu, Heng-Yuan Lee, Yu-Sheng Chen, Pan-Shiu Chen, Kan-Hsueh Tsai, Wei-Su Chen, Chien-Hua Hsu, Po-Tsung Tu, Chen, Frederick T., Ming-Jinn Tsai, Tzu-Kun Ku, Pei-Hua Wang
Published in 2016 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) (01.04.2016)
Published in 2016 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) (01.04.2016)
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Conference Proceeding
Statistical analysis of retention behavior and lifetime prediction of HfOBxB-based RRAM
Lijie Zhang, Ru Huang, Yen-Ya Hsu, Chen, F T, Heng-Yuan Lee, Yu-Sheng Chen, Wei-Su Chen, Pei-Yi Gu, Wen-Hsing Liu, Shun-Min Wang, Chen-Han Tsai, Ming-Jinn Tsai, Pang-Shiu Chen
Published in 2011 International Reliability Physics Symposium (01.04.2011)
Published in 2011 International Reliability Physics Symposium (01.04.2011)
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Conference Proceeding
Good memory performance and coexistence of bipolar and unipolar resistive switching for CMOS compatible Ti/HfOx/W memory
Kan-Hsueh Tsai, Pang-Shiu Chen, Tai-Yuan Wu, Yu-Sheng Chen, Heng-Yuan Lee, Wei-Su Chen, Chen-Han Tsai, Pei-Yi Gu, Rahaman, S. Z., Yu-De Lin, Chen, F., Ming-Jinn Tsai, Tzu-Kun Ku
Published in 2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) (01.04.2013)
Published in 2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) (01.04.2013)
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Conference Proceeding