Insulators for 2D nanoelectronics: the gap to bridge
Illarionov, Yury Yu, Knobloch, Theresia, Jech, Markus, Lanza, Mario, Akinwande, Deji, Vexler, Mikhail I., Mueller, Thomas, Lemme, Max C., Fiori, Gianluca, Schwierz, Frank, Grasser, Tibor
Published in Nature communications (07.07.2020)
Published in Nature communications (07.07.2020)
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Journal Article
Machine learning force field for thermal oxidation of silicon
Cvitkovich, Lukas, Fehringer, Franz, Wilhelmer, Christoph, Milardovich, Diego, Waldhör, Dominic, Grasser, Tibor
Published in The Journal of chemical physics (14.10.2024)
Published in The Journal of chemical physics (14.10.2024)
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Journal Article
Modeling of negative bias temperature instability
Grasser, Tibor, Selberherr, Siegfried
Published in Journal of Telecommunications and Information Technology (01.06.2023)
Published in Journal of Telecommunications and Information Technology (01.06.2023)
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Journal Article
Challenges for Nanoscale CMOS Logic Based on Two-Dimensional Materials
Knobloch, Theresia, Selberherr, Siegfried, Grasser, Tibor
Published in Nanomaterials (Basel, Switzerland) (01.10.2022)
Published in Nanomaterials (Basel, Switzerland) (01.10.2022)
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Journal Article
The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction-Diffusion to Switching Oxide Traps
Grasser, T., Kaczer, B., Goes, W., Reisinger, H., Aichinger, T., Hehenberger, P., Wagner, P., Schanovsky, F., Franco, J., Luque, María Toledano, Nelhiebel, M.
Published in IEEE transactions on electron devices (01.11.2011)
Published in IEEE transactions on electron devices (01.11.2011)
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Journal Article
Predictive Hot-Carrier Modeling of n-Channel MOSFETs
Bina, Markus, Tyaginov, Stanislav, Franco, Jacopo, Rupp, Karl, Wimmer, Yannick, Osintsev, Dmitry, Kaczer, Ben, Grasser, Tibor
Published in IEEE transactions on electron devices (01.09.2014)
Published in IEEE transactions on electron devices (01.09.2014)
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Journal Article
Analysis and EOT Scaling on Top‐ and Double‐Gate 2D CVD‐Grown Monolayer MoS2 FETs
Patoary, Naim Hossain, Mamun, Fahad Al, Xie, Jing, Grasser, Tibor, Sanchez Esqueda, Ivan
Published in Advanced electronic materials (01.11.2024)
Published in Advanced electronic materials (01.11.2024)
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Journal Article
Semi-Automated Extraction of the Distribution of Single Defects for nMOS Transistors
Stampfer, Bernhard, Schanovsky, Franz, Grasser, Tibor, Waltl, Michael
Published in Micromachines (Basel) (23.04.2020)
Published in Micromachines (Basel) (23.04.2020)
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Journal Article
DELMEP: a deep learning algorithm for automated annotation of motor evoked potential latencies
Milardovich, Diego, Souza, Victor H., Zubarev, Ivan, Tugin, Sergei, Nieminen, Jaakko O., Bigoni, Claudia, Hummel, Friedhelm C., Korhonen, Juuso T., Aydogan, Dogu B., Lioumis, Pantelis, Taherinejad, Nima, Grasser, Tibor, Ilmoniemi, Risto J.
Published in Scientific reports (22.05.2023)
Published in Scientific reports (22.05.2023)
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Journal Article
Over- and Undercoordinated Atoms as a Source of Electron and Hole Traps in Amorphous Silicon Nitride (a-Si3N4)
Wilhelmer, Christoph, Waldhoer, Dominic, Cvitkovich, Lukas, Milardovich, Diego, Waltl, Michael, Grasser, Tibor
Published in Nanomaterials (Basel, Switzerland) (01.08.2023)
Published in Nanomaterials (Basel, Switzerland) (01.08.2023)
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Journal Article
Modeling of Hot-Carrier Degradation in nLDMOS Devices: Different Approaches to the Solution of the Boltzmann Transport Equation
Sharma, Prateek, Tyaginov, Stanislav, Wimmer, Yannick, Rudolf, Florian, Rupp, Karl, Bina, Markus, Enichlmair, Hubert, Jong-Mun Park, Minixhofer, Rainer, Ceric, Hajdin, Grasser, Tibor
Published in IEEE transactions on electron devices (01.06.2015)
Published in IEEE transactions on electron devices (01.06.2015)
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