Physics of Current Filamentation in ggNMOS Devices Under ESD Condition Revisited
Paul, Milova, Russ, Christian, Kumar, B. Sampath, Gossner, Harald, Shrivastava, Mayank
Published in IEEE transactions on electron devices (01.07.2018)
Published in IEEE transactions on electron devices (01.07.2018)
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Journal Article
Physical Insight Toward Heat Transport and an Improved Electrothermal Modeling Framework for FinFET Architectures
Shrivastava, M., Agrawal, M., Mahajan, S., Gossner, H., Schulz, T., Sharma, D. K., Rao, V. R.
Published in IEEE transactions on electron devices (01.05.2012)
Published in IEEE transactions on electron devices (01.05.2012)
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Journal Article
On the Electrostatic Discharge Robustness of Graphene
Hong Li, Russ, Christian C., Wei Liu, Johnsson, David, Gossner, Harald, Banerjee, Kaustav
Published in IEEE transactions on electron devices (01.06.2014)
Published in IEEE transactions on electron devices (01.06.2014)
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Journal Article
Physics of Current Filamentation in ggNMOS Revisited: Was Our Understanding Scientifically Complete?
Paul, Milova, Russ, Christian, Kumar, B. Sampath, Gossner, Harald, Shrivastava, Mayank
Published in 2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID) (01.01.2017)
Published in 2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID) (01.01.2017)
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Conference Proceeding
Reliability aspects of gate oxide under ESD pulse stress
Ille, Adrien, Stadler, Wolfgang, Pompl, Thomas, Gossner, Harald, Brodbeck, Tilo, Esmark, Kai, Riess, Philipp, Alvarez, David, Chatty, Kiran, Gauthier, Robert, Bravaix, Alain
Published in Microelectronics and reliability (01.12.2009)
Published in Microelectronics and reliability (01.12.2009)
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Journal Article
A Dedicated TLP Set-Up to Investigate the ESD Robustness of RF Elements and Circuits
Wolf, Heinrich, Gieser, Horst, Soldner, Wolfgang, Goßner, Harald
Published in Microelectronics and reliability (01.09.2005)
Published in Microelectronics and reliability (01.09.2005)
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Journal Article
Conference Proceeding
Modular Measurement System for System-Efficient ESD Design on System and Component Level
Speckbacher, Lucas, Pak, Amin, Gholizadeh, Mehdi, Mousavi, Seyed Mostafa, Pommerenke, David Johannes, Gossner, Harald
Published in IEEE transactions on electromagnetic compatibility (01.12.2022)
Published in IEEE transactions on electromagnetic compatibility (01.12.2022)
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Journal Article
Device, Circuit, and Reliability Assessment of Drain-Extended FinFETs for Sub-14 nm System on Chip Applications
Kumar, B. Sampath, Ajay, Paul, Milova, Somayaji, Jhnanesh, Gossner, Harald, Shrivastava, Mayank
Published in IEEE transactions on electron devices (01.11.2020)
Published in IEEE transactions on electron devices (01.11.2020)
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Journal Article
A Tunnel FET for V DD Scaling Below 0.6 V With a CMOS-Comparable Performance
Asra, Ram, Shrivastava, Mayank, Murali, Kota VRM, Pandey, Rajan K, Gossner, Harald, Rao, VRamgopal
Published in IEEE transactions on electron devices (01.07.2011)
Published in IEEE transactions on electron devices (01.07.2011)
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Journal Article
IC Pin Modeling and Mitigation of ESD-Induced Soft Failures
Maghlakelidze, Giorgi, Shen, Li, Gossner, Harald, Pommerenke, David, Kim, DongHyun
Published in IEEE transactions on electromagnetic compatibility (01.04.2021)
Published in IEEE transactions on electromagnetic compatibility (01.04.2021)
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Journal Article
A Systematic Method to Characterize the Soft-Failure Susceptibility of the I/Os on an Integrated Circuit Due to Electrostatic Discharge
Orr, Benjamin J., Koch, Sebastian, Gossner, Harald, Pommerenke, David J.
Published in IEEE transactions on electromagnetic compatibility (01.02.2020)
Published in IEEE transactions on electromagnetic compatibility (01.02.2020)
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Journal Article
Drain-Extended FinFET With Embedded SCR (DeFinFET-SCR) for High-Voltage ESD Protection and Self-Protected Designs
Paul, Milova, Sampath Kumar, B., Karmel Nagothu, Kranthi, Singhal, Pulkit, Gossner, Harald, Shrivastava, Mayank
Published in IEEE transactions on electron devices (01.12.2019)
Published in IEEE transactions on electron devices (01.12.2019)
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Journal Article
Challenges & Physical Insights Into the Design of Fin-Based SCRs and a Novel Fin-SCR for Efficient On-Chip ESD Protection
Paul, Milova, Sampath Kumar, B., Russ, Christian, Gossner, Harald, Shrivastava, Mayank
Published in IEEE transactions on electron devices (01.11.2018)
Published in IEEE transactions on electron devices (01.11.2018)
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Journal Article