A flexible instrument control and image acquisition system for a scanning electron microscope
KAPP, O. H., SMITH, D. R., JENDRASZKIEWICZ, G., GORODEZKY, I., KIM, KWANG‐JE, CREWE, A. V.
Published in Journal of microscopy (Oxford) (01.08.2006)
Published in Journal of microscopy (Oxford) (01.08.2006)
Get full text
Journal Article