Determination of funnel length from cross section versus LET measurements
Golke, K.W.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1993)
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1993)
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Journal Article
Conference Proceeding
Limiting Upset Cross Sections of SEU Hardened SOI SRAMs
Liu, M.S., Liu, H.Y., Brewster, N., Nelson, D., Golke, K.W., Kirchner, G., Hughes, H.L., Campbell, A., Ziegler, J.F.
Published in IEEE transactions on nuclear science (01.12.2006)
Published in IEEE transactions on nuclear science (01.12.2006)
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Journal Article
Characterization Summary for a Radiation Hardened 16KX1 SRAM
Passow, Robin H., Christiansen, Joel J., Rabe, Robert L., Golke, Keith W.
Published in IEEE transactions on nuclear science (01.12.1986)
Published in IEEE transactions on nuclear science (01.12.1986)
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Journal Article