From MFM Capacitors Toward Ferroelectric Transistors: Endurance and Disturb Characteristics of -Based FeFET Devices
Mueller, Stefan, Muller, Johannes, Hoffmann, Raik, Yurchuk, Ekaterina, Schlosser, Till, Boschke, Roman, Paul, Jan, Goldbach, Matthias, Herrmann, Tom, Zaka, Alban, Schroder, Uwe, Mikolajick, Thomas
Published in IEEE transactions on electron devices (01.12.2013)
Published in IEEE transactions on electron devices (01.12.2013)
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Journal Article
From MFM Capacitors Toward Ferroelectric Transistors: Endurance and Disturb Characteristics of HfO2-Based FeFET Devices
MUELLER, Stefan, MÜLLER, Johannes, SCHRÖDER, Uwe, MIKOLAJICK, Thomas, HOFFMANN, Raik, YURCHUK, Ekaterina, SCHLÖSSER, Till, BOSCHKE, Roman, PAUL, Jan, GOLDBACH, Matthias, HERRMANN, Tom, ZAKA, Alban
Published in IEEE transactions on electron devices (01.12.2013)
Published in IEEE transactions on electron devices (01.12.2013)
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Journal Article
Leakage current and defect characterization of p +n-source/drain diodes
Roll, Guntrade, Goldbach, Matthias, Frey, Lothar
Published in Microelectronics and reliability (01.12.2011)
Published in Microelectronics and reliability (01.12.2011)
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Journal Article
Leakage current and defect characterization of p super(+n-source/drain diodes)
Roll, Guntrade, Goldbach, Matthias, Frey, Lothar
Published in Microelectronics and reliability (01.12.2011)
Published in Microelectronics and reliability (01.12.2011)
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Journal Article
Impact of carbon junction implant on leakage currents and defect distribution: Measurement and simulation
Roll, Guntrade, Jakschik, Stefan, Burenkov, Alexander, Goldbach, Matthias, Mikolajick, Thomas, Frey, Lothar
Published in Solid-state electronics (01.11.2011)
Published in Solid-state electronics (01.11.2011)
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Journal Article
Conference Proceeding
SRAM read current variability and its dependence on transistor statistics
Venugopalan, Sriramkumar, Joshi, Vivek, Zamudio, Luis, Goldbach, Matthias, Burbach, Gert, Van Bentum, Ralf, Balasubramanian, Sriram
Published in Proceedings of the IEEE 2013 Custom Integrated Circuits Conference (01.09.2013)
Published in Proceedings of the IEEE 2013 Custom Integrated Circuits Conference (01.09.2013)
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Conference Proceeding