by Courtade, L., Turquat, Ch, Muller, Ch, Lisoni, J.G., Goux, L., Wouters, D.J., Goguenheim, D., Roussel, P., Ortega, L.
Published in Thin solid films (01.04.2008)

by Carmona, M., Rebuffat, B., Delalleau, J., Gagliano, O., Lopez, L., Ogier, J.-L., Goguenheim, D.
Published in Microelectronic engineering (01.09.2013)

by Goguenheim, D., Pic, D., Ogier, J.L.
Published in Microelectronics and reliability (01.09.2007)

by Menou, N., Castagnos, A.-M., Muller, Ch, Goguenheim, D., Goux, L., Wouters, D. J., Hodeau, J.-L., Dooryhee, E., Barrett, R.
Published in Journal of applied physics (15.02.2005)

by PIC, D, GOGUENHEIM, D, OGIER, J. L
Published in Microelectronics and reliability (01.03.2008)

by Pic, D., Goguenheim, D., Ogier, J.-L.
Published in Microelectronics and reliability (01.09.2007)

by Bravaix, A, Guérin, C, Goguenheim, D, Huard, V, Roy, D, Besset, C, Renard, S, Randriamihaja, Y M, Vincent, E
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)

by Bravaix, A, Goguenheim, D, Revil, N, Vincent, E
Published in Microelectronic engineering (01.04.2004)

by Trapes, C., Goguenheim, D., Bravaix, A.
Published in Microelectronics and reliability (01.05.2005)

by Bravaix, A., Goguenheim, D., Revil, N., Vincent, E.
Published in Microelectronics and reliability (2004)

by Bravaix, A., Goguenheim, D., Denais, M., Huard, V., Parthasarathy, C., Perrier, F., Revil, N., Vincent, E.
Published in Microelectronics and reliability (01.09.2005)

by Benard, C., Ogier, J.-L., Goguenheim, D.
Published in 2008 IEEE International Integrated Reliability Workshop Final Report (01.10.2008)

by Goguenheim, D., Bravaix, A., Gomri, S., Moragues, J.M., Monserie, C., Legrand, N., Boivin, P.
Published in Microelectronics and reliability (01.03.2005)

by Bravaix, A., Goguenheim, D., Revil, N., Vincent, E.
Published in Microelectronics and reliability (01.09.2001)

by BRAVAIX, A, GOGUENHEIM, D, REVIL, N, VINCENT, E
Published in Microelectronic engineering (01.11.2001)

by Bravaix, A., Trapes, C., Goguenheim, D., Revil, N., Vincent, E.
Published in Microelectronics and reliability (01.08.2003)

by PIC, N, GLACHANT, A, NITSCHE, S, HOARAU, J. Y, GOGUENHEIM, D, VUILLAUME, D, SIBAI, A, AUTRAN, J.-L
Published in Journal of non-crystalline solids (01.02.2001)

by Goguenheim, D, Bravaix, A, Monserie, C, Moragues, J.M, Lambert, P, Boivin, P
Published in Solid-state electronics (01.08.2001)

by VUILLAUME, D, BRAVAIX, A, GOGUENHEIM, D
Published in Microelectronics and reliability (01.02.1998)

by Bravaix, A., Goguenheim, D., Revil, N., Vincent, E., Varrot, M., Mortini, P.
Published in Microelectronics and reliability (1999)