by GOESSEL MICHAEL, KERN THOMAS
Year of Publication 27.08.2018

by Rabenalt, T., Richter, M., Poehl, F., Goessel, M.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.06.2012)

by Rabenalt, Thomas, Goessel, Michael, Leininger, Andreas
Published in Journal of electronic testing (01.02.2011)

by Goessel, Michael, Kern, Thomas
Year of Publication 02.05.2024

by Goessel, Michael, Kern, Thomas
Year of Publication 02.01.2024

by Goessel, Michael, Kern, Thomas
Year of Publication 30.03.2023

by Goessel, Michael, Kern, Thomas
Year of Publication 27.09.2022

by Goessel, Michael, Kern, Thomas
Year of Publication 14.06.2022

by Georgakos, Georg, Goessel, Michael
Year of Publication 10.05.2022

by Goessel, Michael, Kern, Thomas
Year of Publication 26.10.2021

by Goessel, Michael, Kern, Thomas
Year of Publication 16.09.2021

by Goessel, Michael, Kern, Thomas
Year of Publication 15.07.2021

by Goessel, Michael, Kern, Thomas, Klockmann, Alexander
Year of Publication 01.08.2024

by Gossel, Michael, Sogomonyan, Egor
Published in Fundamenta informaticae (01.01.2008)

by Goessel, Michael, Kern, Thomas
Year of Publication 16.03.2021

by Rabenalt, Thomas, Goessel, Michael, Kern, Thomas
Year of Publication 18.04.2024

by Georgakos, Georg, Goessel, Michael
Year of Publication 04.02.2021

by Rabenalt, Thomas, Goessel, Michael, Kern, Thomas
Year of Publication 06.02.2024

by Goessel, Michael, Kern, Thomas
Year of Publication 05.11.2020

by Hilscher, Martin, Braun, Michael, Richter, Michael, Leininger, Andreas, Gössel, Michael
Published in Journal of electronic testing (01.08.2009)