by Sterkens, Wouter, Diaz-Romero, Dillam, Goedemé, Toon, Dewulf, Wim, Peeters, Jef R.
Published in Resources, conservation and recycling (01.05.2021)

by Neven, Robby, Goedemé, Toon
Published in Metals (Basel ) (01.06.2021)

by Coudron, Inge, Puttemans, Steven, Goedemé, Toon, Vandewalle, Patrick
Published in Sensors (Basel, Switzerland) (03.12.2020)

by Goedemé, Toon, Nuttin, Marnix, Tuytelaars, Tinne, Van Gool, Luc
Published in International journal of computer vision (01.09.2007)

by Díaz-Romero, Dillam, Sterkens, Wouter, Van den Eynde, Simon, Goedemé, Toon, Dewulf, Wim, Peeters, Jef
Published in Resources, conservation and recycling (01.09.2021)

by Díaz-Romero, Dillam Jossue, Van den Eynde, Simon, Sterkens, Wouter, Eckert, Alexander, Zaplana, Isiah, Goedemé, Toon, Peeters, Jef
Published in Spectrochimica acta. Part B: Atomic spectroscopy (01.10.2022)

by Zhang, Mingyang, Van Beeck, Kristof, Goedemé, Toon
Published in Journal of imaging (13.03.2024)

by Díaz-Romero, Dillam Jossue, Van den Eynde, Simon, Sterkens, Wouter, Engelen, Bart, Zaplana, Isiah, Dewulf, Wim, Goedemé, Toon, Peeters, Jef
Published in Resources, conservation and recycling (01.06.2022)

by Van den Broeck, Wouter A. J., Goedemé, Toon, Loopmans, Maarten
Published in Remote sensing (Basel, Switzerland) (01.12.2022)

by Van den Broeck, Wouter A. J., Goedemé, Toon
Published in Remote sensing (Basel, Switzerland) (01.10.2022)

by Le Jeune, Laurens, Goedeme, Toon, Mentens, Nele
Published in IEEE access (2021)

by Somers, Matthijs H., Azman, Samet, Bollansée, Giel, Goedemé, Toon, Leermakers, Martine, Alonso-Fariñas, Bernabé, Appels, Lise
Published in Chemosphere (Oxford) (01.08.2020)

by Hulens, Dries, Van Ranst, Wiebe, Cao, Ying, Goedemé, Toon
Published in Machines (Basel) (01.05.2022)

by Vandersteegen, Maarten, Van Beeck, Kristof, Goedemé, Toon
Published in Electronics (Basel) (01.11.2021)

by Sterkens, Wouter, Bracquené, Ellen, Díaz‐Romero, Dillam Jossue, Goedemé, Toon, Dewulf, Wim, Peeters, Jef R.
Published in Journal of industrial ecology (01.06.2023)

by Thys, Simen, Ranst, Wiebe Van, Goedeme, Toon
Published in 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) (01.06.2019)

by Vandersteegen, Maarten, Van Beeck, Kristof, Goedemé, Toon
Published in Image Analysis and Recognition

by Puttemans, Steven, Goedemé, Toon, Mian, Ajmal, Moeslund, Thomas B., Gade, Rikke
Published in Machine vision and applications (01.03.2020)

by Ophoff, Tanguy, Gullentops, Cédric, Van Beeck, Kristof, Goedemé, Toon
Published in Journal of imaging (01.04.2021)

by De Beugher, Stijn, Brône, Geert, Goedemé, Toon
Published in Language Resources and Evaluation (01.06.2018)