by Balatti, S., Larentis, S., Gilmer, D. C., Ielmini, D.
Published in Advanced materials (Weinheim) (13.03.2013)

by Goel, N., Gilmer, D.C., Park, H., Diaz, V., Sun, Y., Price, J., Park, C., Pianetta, P., Kirsch, P.D., Jammy, R.
Published in IEEE electron device letters (01.03.2009)

by Schaeffer, J.K., Gilmer, D.C., Capasso, C., Kalpat, S., Taylor, B., Raymond, M.V., Triyoso, D., Hegde, R., Samavedam, S.B., White, B.E.
Published in Microelectronic engineering (01.09.2007)

by Gilmer, D C, Rueckes, T, Cleveland, L
Published in Nanotechnology (03.04.2018)

by Campbell, S. A., Kim, H.-S., Gilmer, D. C., He, B., Ma, T., Gladfelter, W. L.
Published in IBM journal of research and development (01.05.1999)

by Privitera, S., Bersuker, G., Butcher, B., Kalantarian, A., Lombardo, S., Bongiorno, C., Geer, R., Gilmer, D.C., Kirsch, P.D.
Published in Microelectronic engineering (01.09.2013)

by Kukli, K., Ritala, M., Pore, V., Leskelä, M., Sajavaara, T., Hegde, R. I., Gilmer, D. C., Tobin, P. J., Jones, A. C., Aspinall, H. C.
Published in Chemical vapor deposition (01.03.2006)

by Veksler, D., Bersuker, G., Bushmaker, A. W., Mason, M., Shrestha, P. R., Cheung, K. P., Campbell, J. P., Rueckes, T., Cleveland, L., Luan, H., Gilmer, D. C.
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)

by Gilmer, D.C., Hegde, R., Cotton, R., Smith, J., Dip, L., Garcia, R., Dhandapani, V., Triyoso, D., Roan, D., Franke, A., Rai, R., Prabhu, L., Hobbs, C., Grant, J.M., La, L., Samavedam, S., Taylor, B., Tseng, H., Tobin, P.
Published in Microelectronic engineering (01.09.2003)

by Bersuker, G, Gilmer, D C, Veksler, D, Yum, J, Park, H, Lian, S, Vandelli, L, Padovani, A, Larcher, L, McKenna, K, Shluger, A, Iglesias, V, Porti, M, Nafria, M, Taylor, W, Kirsch, P D, Jammy, R
Published in 2010 International Electron Devices Meeting (01.12.2010)

by Butcher, B., Bersuker, G., Gilmer, D. C., Larcher, L., Padovani, A., Vandelli, L., Geer, R., Kirsch, P. D.
Published in 2013 IEEE International Electron Devices Meeting (01.12.2013)

by Deora, S., Bersuker, G., Sung, M. G., Gilmer, D. C., Kirsch, P. D., Li, H.-F, Chong, H., Gausepohl, S.
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)

by Hobbs, C.C., Fonseca, L.R.C., Knizhnik, A., Dhandapani, V., Samavedam, S.B., Taylor, W.J., Grant, J.M., Dip, L.G., Triyoso, D.H., Hegde, R.I., Gilmer, D.C., Garcia, R., Roan, D., Lovejoy, M.L., Rai, R.S., Hebert, E.A., Hsing-Huang Tseng, Anderson, S.G.H., White, B.E., Tobin, P.J.
Published in IEEE transactions on electron devices (01.06.2004)

by Privitera, S., Bersuker, G., Lombardo, S., Bongiorno, C., Gilmer, D.C.
Published in Solid-state electronics (01.09.2015)

by Gilmer, D C, Bersuker, G, Park, H.-Y, Park, C, Butcher, B, Wang, W, Kirsch, P D, Jammy, R
Published in 2011 3rd IEEE International Memory Workshop (IMW) (01.05.2011)

by Nardi, F., Balatti, S., Larentis, S., Gilmer, D. C., Ielmini, D.
Published in IEEE transactions on electron devices (01.01.2013)

by Hyeon-Seag Kim, Campbell, S.A., Gilmer, C.
Published in IEEE electron device letters (01.10.1997)

by Veksler, D., Bersuker, G., Chakrabarti, B., Vogel, E., Deora, S., Matthews, K., Gilmer, D. C., Li, H.-F, Gausepohl, S., Kirsch, P. D.
Published in 2012 International Electron Devices Meeting (01.12.2012)

by GILMER, D. C, COLOMBO, D. G, TAYLOR, C. J, ROBERTS, J, HAUGSTAD, G, CAMPBELL, S. A, KIM, H.-S, WILK, G. D, GRIBELYUK, M. A, GLADFELTER, W. L
Published in Chemical vapor deposition (1998)

by Butcher, B., Bersuker, G., Young-Fisher, K. G., Gilmer, D. C., Kalantarian, A., Nishi, Y., Geer, R., Kirsch, P. D., Jammy, R.
Published in 2012 4th IEEE International Memory Workshop (01.05.2012)