Multi-element analysis of a thermographic material by means of solid sampling-electrothermal vaporization-inductively coupled plasma mass spectrometry
Resano, M, Balcaen, L, Vanhaecke, F, Moens, L, Geuens, I
Published in Spectrochimica acta. Part B: Atomic spectroscopy (15.03.2002)
Published in Spectrochimica acta. Part B: Atomic spectroscopy (15.03.2002)
Get full text
Journal Article
Imaging TOF-SIMS for the surface analysis of silver halide microcrystals
Lenaerts, J., Gijbels, R., Van Vaeck, L., Verlinden, G., Geuens, I.
Published in Applied surface science (15.01.2003)
Published in Applied surface science (15.01.2003)
Get full text
Journal Article
Determination of ruthenium in photographic materials using solid sampling electrothermal vaporization inductively coupled plasma mass spectrometry
YI HU, VANHAECKE, F, MOENS, L, DAMS, R, GEUENS, I
Published in Journal of analytical atomic spectrometry (1999)
Published in Journal of analytical atomic spectrometry (1999)
Get full text
Conference Proceeding
Journal Article
Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS)
VERLINDEN, G, GIJBELS, R, GEUENS, I, DE KEYZER, R
Published in Journal of analytical atomic spectrometry (1999)
Published in Journal of analytical atomic spectrometry (1999)
Get full text
Conference Proceeding
Journal Article
Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary-ion mass spectrometry (SIMS)
LENAERTS, Jens, VERLINDEN, Geert, IGNATOVA, Velislava A, VAN VAECK, Luc, GIJBELS, Renaat, GEUENS, Ingrid
Published in Analytical and bioanalytical chemistry (01.07.2001)
Published in Analytical and bioanalytical chemistry (01.07.2001)
Get full text
Conference Proceeding
Journal Article
Characterization of AgxAuy nano particles by TEM and STEM
DE VYT, A, GIJBELS, R, DAVOCK, H, VAN ROOST, C, GEUENS, I
Published in Journal of analytical atomic spectrometry (1999)
Published in Journal of analytical atomic spectrometry (1999)
Get full text
Conference Proceeding
Journal Article
Imaging TOF-SIMS for the surface analysis of silver halide microcrystals
LENAERTS, J, GIJBELS, R, VAN VAECK, L, VERLINDEN, G, GEUENS, I
Published in Applied surface science (2003)
Get full text
Published in Applied surface science (2003)
Conference Proceeding
Automated Particle Analysis of Populations of Silver Halide Microcrystals by Electron Probe Microanalysis under Cryogenic Conditions
Gregory, Caroline L, Nullens, Henri A, Gijbels, Renaat H, Van Espen, Pierre J, Geuens, Ingrid, De Keyzer, René
Published in Analytical chemistry (Washington) (01.07.1998)
Published in Analytical chemistry (Washington) (01.07.1998)
Get full text
Journal Article
The primary energy dependence of the backscattered electron coefficient up to 100 keV
Geuens, I., Gijbels, R., Jacob, W., Verbeeck, A., De Keyzer, R.
Published in Micron and microscopica acta (1990)
Published in Micron and microscopica acta (1990)
Get full text
Journal Article