Voltage controlled oscillator area reduction in nano-scale CMOS
Jha, Amit, Liao, Ken, Yeap, Geoffrey, Kenneth, K. O.
Published in 2014 IEEE Radio Frequency Integrated Circuits Symposium (01.06.2014)
Published in 2014 IEEE Radio Frequency Integrated Circuits Symposium (01.06.2014)
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Conference Proceeding
Holistic technology optimization and key enablers for 7nm mobile SoC
Song, S. C., Xu, J., Mojumder, N. N., Rim, K., Yang, D., Bao, J., Zhu, J., Wang, J., Badaroglu, M., Machkaoutsan, V., Narayanasetti, P., Bucki, B., Fischer, J., Yeap, Geoffrey
Published in 2015 Symposium on VLSI Technology (VLSI Technology) (01.06.2015)
Published in 2015 Symposium on VLSI Technology (VLSI Technology) (01.06.2015)
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Conference Proceeding
Journal Article
Novel Critical Path Aware transistor optimization for mobile SoC device-circuit co-design
Mojumder, Niladri N., Song, S. C., Wang, Joseph, Ken Lin, Rim, Ken, Xu, Jeff, Yeap, Geoffrey
Published in 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers (01.06.2014)
Published in 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers (01.06.2014)
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Conference Proceeding
Plenary talk: Ubiquitous mobile computing - Growth driver for the semiconductor industry: Technology trends, challenges and opportunities
Yeap, Geoffrey
Published in 2014 IEEE Workshop On Microelectronics And Electron Devices (WMED) (01.04.2014)
Published in 2014 IEEE Workshop On Microelectronics And Electron Devices (WMED) (01.04.2014)
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Conference Proceeding
Journal Article
(Invited) Comparative Study for SRAM Cells in Near and Sub-Threshold Region
Yang, Young Hwi, Park, Ju Hyun, Song, Seung Chul, Yang, Frank Bin, Wang, Joseph, Yeap, Geoffrey, Jung, Seong Ook
Published in ECS transactions (01.01.2013)
Published in ECS transactions (01.01.2013)
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Journal Article
Electrostatics and performance benchmarking using all types of III-V multi-gate FinFETs for sub 7nm technology node logic application
Baek, R.-H, Kim, D.-H, Kim, T.-W, Shin, Cs, Park, Wk, Michalak, T., Borst, C., Song, S. C., Yeap, Geoffrey, Hill, R., Hobbs, C., Maszara, W., Kirsch, P.
Published in 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers (01.06.2014)
Published in 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers (01.06.2014)
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Conference Proceeding
Chip Package Interaction with fine pitch Cu pillar bump using mass reflow and thermal compression bonding assembly process for 20nm/16nm and beyond
Zhao, Lily, Bao, Andy, Yangyang Sun, Chun-Jen Chen, Tsai, Scott, Lee, Kenny, Xuefeng Zhang, Perry, Dan, Kalleberg, Tor, Han, Michael, Bezuk, Steve, Yeap, Geoffrey
Published in 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers (01.06.2014)
Published in 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers (01.06.2014)
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Conference Proceeding
High performance mobile SoC design and technology co-optimization to mitigate high-K metal gate process induced variations
Yang, Sam, Lixin Ge, Lin, Jeff, Han, Michael, Da Yang, Wang, Joseph, Mahmood, Kasim, Song, Tony, Yuan, Dana, Dongwon Seo, Pedrali-Noy, Marzio, Alladi, Dinesh, Wadhwa, Sameer, Xiaoliang Bai, Liang Dai, Sei Seung Yoon, Terzioglu, Esin, Bazarjani, Seyfi, Yeap, Geoffrey
Published in 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers (01.06.2014)
Published in 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers (01.06.2014)
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Conference Proceeding
Transistor-interconnect mobile system-on-chip co-design method for holistic battery energy minimization
Mojumder, N. N., Song, S. C., Rim, K., Xu, J., Wang, J., Zhu, J., Vratonjic, M., Lin, K., Saint-Laurent, M., Bassett, P., Yeap, Geoffrey
Published in 2015 Symposium on VLSI Technology (VLSI Technology) (01.06.2015)
Published in 2015 Symposium on VLSI Technology (VLSI Technology) (01.06.2015)
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Journal Article
RF and mixed-signal performances of a low cost 28nm low-power CMOS technology for wireless system-on-chip applications
Ming-Ta Yang, Ken Liao, Welstand, R., Teng, Charles, Wing Sy, Ying Chen, Dutta, R., Chidambaram, P., Han, Michael, Yang Du, Yeap, G.
Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)
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Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)
Conference Proceeding
SRAM bitcell design for low voltage operation in deep submicron technologies
Young Hwi Yang, Jisu Kim, Hyunkook Park, Wang, Joseph, Yeap, G, Seong-Ook Jung
Published in 2011 IEEE International Conference on IC Design & Technology (01.05.2011)
Published in 2011 IEEE International Conference on IC Design & Technology (01.05.2011)
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Conference Proceeding
Non-Gaussian distribution of SRAM read current and design impact to low power memory using Voltage Acceleration Method
Wang, J., Ping Liu, Yandong Gao, Deshmukh, Pankaj, Yang, Sam, Ying Chen, Wing Sy, Lixin Ge, Terzioglu, Esin, Abu-Rahma, Mohamed, Garg, Manish, Sei Seung Yoon, Han, Michael, Sani, Mehdi, Yeap, Geoffrey
Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)
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Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)
Conference Proceeding
A Reliability Enhanced 5nm CMOS Technology Featuring 5th Generation FinFET with Fully-Developed EUV and High Mobility Channel for Mobile SoC and High Performance Computing Application
Liu, J.C., Mukhopadhyay, S., Kundu, Amit, Chen, S.H., Wang, H.C., Huang, D.S., Lee, J.H., Wang, M.I., Lu, Ryan, Lin, S.S., Chen, Y.M., Shang, H.L., Wang, P.W., Lin, H.C., Yeap, Geoffrey, He, Jun
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)
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Conference Proceeding
Low power embedded memory design - process to system level considerations
Terzioglu, E, Sei Seung Yoon, ChangHo Jung, Chaba, R, Boynapalli, V, Abu-Rahma, M, Wang, J, Yang, S, Nallapati, G, Thean, A, Chidambaram, C, Han, M, Yeap, G, Sani, M
Published in 2011 IEEE International Conference on IC Design & Technology (01.05.2011)
Published in 2011 IEEE International Conference on IC Design & Technology (01.05.2011)
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Conference Proceeding
Impact of tunnel currents and channel resistance on the characterization of channel inversion layer charge and polysilicon-gate depletion of sub-20-Å gate oxide MOSFETs
Ahmed, K., Ibok, E., Yeap, G.C.-F., Qi Xiang, Ogle, B., Wortman, J.J., Hauser, J.R.
Published in IEEE transactions on electron devices (1999)
Published in IEEE transactions on electron devices (1999)
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Journal Article
OPTIMIZED STATIC RANDOM ACCESS MEMORY CELL
Lim, Kian-Long, Yan, Chih-Chuan, Lin, Yu-Kuan, Hung, Lien Jung, Hsu, Kuo-Hsiu, Wang, Ping-Wei, Yeap, Geoffrey, Pao, Chia-Hao, Lin, Shih-Hao
Year of Publication 03.02.2022
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Year of Publication 03.02.2022
Patent
Challenges and opportunities of chip package interaction with fine pitch Cu pillar for 28nm
Bao, Andy, Zhao, Lily, Yangyang Sun, Han, Michael, Yeap, Geoffrey, Bezuk, Steve, Holmes, Pat, Alcira, Cecille, Xuefeng Zhang, Lee, Kenny
Published in 2014 IEEE 64th Electronic Components and Technology Conference (ECTC) (01.05.2014)
Published in 2014 IEEE 64th Electronic Components and Technology Conference (ECTC) (01.05.2014)
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Conference Proceeding
Unified Technology Optimization Platform using Integrated Analysis (UTOPIA) for holistic technology, design and system co-optimization at <= 7nm nodes
Song, S. C., Xu, J., Yang, D., Rim, K., Feng, P., Bao, J., Zhu, J., Wang, J., Nallapati, G., Badaroglu, M., Narayanasetti, P., Bucki, B., Fischer, J., Yeap, Geoffrey
Published in 2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits) (01.06.2016)
Published in 2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits) (01.06.2016)
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Conference Proceeding
Holistic technology optimization and key enablers for 7nm mobile SoC
Song, S. C., Xu, J., Mojumder, N. N., Rim, K., Yang, D., Bao, J., Zhu, J., Wang, J., Badaroglu, M., Machkaoutsan, V., Narayanasetti, P., Bucki, B., Fischer, J., Yeap, Geoffrey
Published in 2015 Symposium on VLSI Circuits (VLSI Circuits) (01.06.2015)
Published in 2015 Symposium on VLSI Circuits (VLSI Circuits) (01.06.2015)
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Conference Proceeding
Journal Article