Investigation of multiple soft breakdown during time-dependent dielectric breakdown
Qiwei Wu, Binfeng Yin, Ke Zhou, Jiong Wang, Jinde Gao
Published in 2017 China Semiconductor Technology International Conference (CSTIC) (01.03.2017)
Published in 2017 China Semiconductor Technology International Conference (CSTIC) (01.03.2017)
Get full text
Conference Proceeding