by Cristoloveanu, S., Athanasiou, S., Bawedin, M., Galy, Ph
Published in IEEE electron device letters (01.02.2017)

by Cristoloveanu, S., Lee, K.H., Parihar, M.S., El Dirani, H., Lacord, J., Martinie, S., Le Royer, C., Barbe, J.-Ch, Mescot, X., Fonteneau, P., Galy, Ph, Gamiz, F., Navarro, C., Cheng, B., Duan, M., Adamu-Lema, F., Asenov, A., Taur, Y., Xu, Y., Kim, Y-T., Wan, J., Bawedin, M.
Published in Solid-state electronics (01.05.2018)

by Galy, Ph, Anghel, L.
Published in Solid-state electronics (01.11.2021)

by Galy, Ph, Jacquier, B., Haendler, S.
Published in Microelectronics and reliability (01.11.2021)

by Galy, Ph, Jacquier, B., Sandrini, J., Arnaud, F.
Published in Microelectronics and reliability (01.09.2023)

by Galy, Ph
Published in 2014 International Semiconductor Conference (CAS) (01.10.2014)

by Galy, Ph, Soto, F., Bourgeat, J., Jacquier, B., Kilchytska, V., Flandre, D.
Published in Microelectronics and reliability (01.11.2020)

by Galy, Ph, de Conti, L., Delahaye, G., Anghel, L., Vinet, M., Cristoloveanu, S.
Published in Microelectronics and reliability (01.09.2019)

by Athanasiou, S., Cristoloveanu, S., Galy, Ph
Published in 2015 International Conference on IC Design & Technology (ICICDT) (01.06.2015)

by Galy, Ph, Dehan, P., Jimenez, J., Heitz, B.
Published in Solid-state electronics (01.11.2013)

by Tmimi, M., D'Amico, S., Duchamp, J-M., Ferrari, Ph, Galy, Ph
Published in 2020 IEEE 63rd International Midwest Symposium on Circuits and Systems (MWSCAS) (01.08.2020)

by Galy, Ph, Bourgeat, J., Marin-Cudraz, D.
Published in 2014 IEEE International Conference on IC Design & Technology (01.05.2014)

by GALY, Ph, DEHAN, P, JIMENEZ, J, HEITZ, B
Published in Solid-state electronics (01.11.2013)

by Cristoloveanu, S., Lee, K.H., Parihar, M.S., El Dirani, H., Lacord, J., Martinie, S., Le Royer, C., Barbe, J.-Ch, Mescot, X., Fonteneau, P., Galy, Ph, Gamiz, F., Navarro, C., Cheng, B., Duan, M., Adamu-Lema, F., Asenov, A., Taur, Y., Xu, Y., Kim, Y-T., Wan, J., Bawedin, M.
Published in Solid-state electronics (01.05.2018)

by Galy, Ph, Haendler, Sebastien
Published in 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS) (01.09.2021)

by El Dirani, H., Lee, K.H., Parihar, M.S., Lacord, J., Martinie, S., Barbe, J-Ch, Mescot, X., Fonteneau, P., Broquin, J.-E., Ghibaudo, G., Galy, Ph, Gamiz, F., Taur, Y., Kim, Y.-T., Cristoloveanu, S., Bawedin, M.
Published in Microelectronic engineering (25.06.2017)

by Galy, Ph, Athanasiou, S., Cristoloveanu, S.
Published in 2015 International Semiconductor Conference (CAS) (01.10.2015)

by Galy, Ph, Lim, T., Bourgeat, J., Jimenez, J., Heitz, B., Marin-Cudraz, D., Benech, Ph, Fournier, J.M.
Published in Microelectronics and reliability (01.09.2013)

by Galy, Ph, Bourgeat, J., Lim, T., Fenouillet-Beranger, C., Golanski, D.
Published in CAS 2013 (International Semiconductor Conference) (01.10.2013)

by Galy, Ph, Bourgeat, J, Jimenez, J, Jacquier, B, Marin-Cudraz, D, Dudit, S
Published in Microelectronics and reliability (01.11.2011)