Local Bonding Analysis of the Valence And Conduction Band Features of TiO(2)
Fleming, I., Fulton, C.C., Lucovsky, G., Rowe, J.E., /North Carolina State U., Ulrich, M.D., /Army Res., Res. Triangle Park /North Carolina State U., Luning, J., /SLAC, SSRL
Published in Journal of applied physics (17.10.2007)
Published in Journal of applied physics (17.10.2007)
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Journal Article
Corrigendum to: “Suppression of Jahn –Teller term-split band edge states in the X-ray absorption spectra of non-crystalline Zr silicates and Si oxynitride alloys, and alloys of ZrO 2 with Y 2O 3” : [Radiat. Phys. Chem. 75 (2006) 1591–1595]
Lucovsky, G., Fulton, C.C., Ju, B.S., Stoute, N.A., Seo, H., Aspnes, D.E., Lüning, J.
Published in Radiation physics and chemistry (Oxford, England : 1993) (2007)
Published in Radiation physics and chemistry (Oxford, England : 1993) (2007)
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Journal Article
Suppression of Jahn–Teller term-split band edge states in the x-ray absorption spectra of non-crystalline Zr silicates and Si oxynitride alloys, and alloys of ZrO 2 with Y 2O 3
Lucovsky, G., Fulton, C.C., Ju, B.S., Stoute, N.A., Tao, S., Aspnes, D.E., Lüning, J.
Published in Radiation physics and chemistry (Oxford, England : 1993) (2006)
Published in Radiation physics and chemistry (Oxford, England : 1993) (2006)
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Journal Article
Corrigendum to: “Suppression of Jahn–Teller term-split band edge states in the X-ray absorption spectra of non-crystalline Zr silicates and Si oxynitride alloys, and alloys of ZrO2 with Y2O3”
Lucovsky, G., Fulton, C.C., Ju, B.S., Stoute, N.A., Seo, H., Aspnes, D.E., Lüning, J.
Published in Radiation physics and chemistry (Oxford, England : 1993) (01.05.2007)
Published in Radiation physics and chemistry (Oxford, England : 1993) (01.05.2007)
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Journal Article
Structural, microstructural, and electrical properties of gold films and Schottky contacts on remote plasma-cleaned, n-type ZnO{l_brace}0001{r_brace} surfaces
Coppa, B.J., Fulton, C.C., Kiesel, S.M., Davis, R.F., Pandarinath, C., Burnette, J.E., Nemanich, R.J., Smith, D.J., Department of Physics, North Carolina State University, P.O. Box 8202, Raleigh, North Carolina 27695, Department of Physics and Astronomy, Center for Solid State Science, Arizona State University, Tempe, Arizona 85287
Published in Journal of applied physics (15.05.2005)
Published in Journal of applied physics (15.05.2005)
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Journal Article
Conduction band-edge d-states in high-k dielectrics due to Jahn–Teller term splittings
Lucovsky, G., Fulton, C.C., Zhang, Y., Luning, J., Edge, L., Whitten, J.L., Nemanich, R.J., Schlom, D.G., Afanase'v, V.V.
Published in Thin solid films (22.08.2005)
Published in Thin solid films (22.08.2005)
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Journal Article
Conference Proceeding
Studies of the coupling of final d-states in mixed Hf and Ti oxides (HfO 2) x (TiO x ) 1− x and other complex oxides
Fulton, C.C., Lucovsky, G., Zhang, Y., Zou, Y., Nemanich, R.J., Ade, H., Whitten, J.L.
Published in Journal of electron spectroscopy and related phenomena (01.06.2005)
Published in Journal of electron spectroscopy and related phenomena (01.06.2005)
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Journal Article
Final state effects in VUV and soft X-ray absorption spectra of transition metal oxides and silicate alloys: comparisons between experiment and ab initio calculations
Lucovsky, G., Zhang, Y., Fulton, C.C., Zou, Y., Nemanich, R.J., Ade, H., Whitten, J.L.
Published in Journal of electron spectroscopy and related phenomena (01.06.2005)
Published in Journal of electron spectroscopy and related phenomena (01.06.2005)
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Journal Article
Conduction band states of transition metal (TM) high- k gate dielectrics as determined from X-ray absorption spectra
Lucovsky, G., Hong, J.G., Fulton, C.C., Stoute, N.A., Zou, Y., Nemanich, R.J., Aspnes, D.E., Ade, H., Schlom, D.G.
Published in Microelectronics and reliability (01.05.2005)
Published in Microelectronics and reliability (01.05.2005)
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Journal Article
Conference Proceeding
Conduction band-edge States associated with the removal of d-state degeneracies by the Jahn-Teller effect
Lucovsky, G., Fulton, C.C., Zhang, Y., Zou, Y., Luning, J., Edge, L.F., Whitten, J.L., Nemanich, R.J., Ade, H., Schlom, D.G., Afanase'v, V.V., Stesmans, A., Zollner, S., Triyoso, D., Rogers, B.R.
Published in IEEE transactions on device and materials reliability (01.03.2005)
Published in IEEE transactions on device and materials reliability (01.03.2005)
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Magazine Article