Search Results - "Frosien, Juergen" :: K.UTB vyhledávací portál

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CHARGED PARTICLE BEAM DEVICE AND METHOD FOR INSPECTING AND/OR IMAGING SAMPLE

by FROSIEN JUERGEN
Year of Publication 16.02.2017

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METHOD FOR REDUCING FRAMES AND COLOR ABERRATION WITHIN CHARGED PARTICLE BEAM DEVICE, AND CHARGED PARTICLE BEAM DEVICE

by FROSIEN JUERGEN
Year of Publication 26.01.2017

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Patent

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1차 하전 입자 빔렛들의 어레이를 이용하여 시료를 검사하기 위한 방법, 1차 하전 입자 빔렛들의 어레이를 이용한 시료의 검사를 위한 하전 입자 빔 디바이스, 및 시료의 검사를 위한 다중-컬럼 현미경

by KRUIT PIETER, FROSIEN JUERGEN
Year of Publication 05.08.2019

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시료를 검사하기 위한 방법 및 하전 입자 다중-빔 디바이스

by KRUIT PIETER, FROSIEN JUERGEN
Year of Publication 31.07.2019

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ELECTRON BEAM WAFER INSPECTION SYSTEM AND ACTUATION METHOD OF THE SAME

by FROSIEN JUERGEN
Year of Publication 20.11.2014

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시편을 검사하기 위한 방법 및 하전 입자 빔 디바이스

by SCHMID RALF, KRUIT PIETER, COOK BENJAMIN JOHN, FROSIEN JUERGEN, BARDAY ROMAN, WINKLER DIETER, NAFTALI RON
Year of Publication 20.06.2022

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SIMPLIFIED PARTICLE EMITTER AND METHOD OF OPERATING THEREOF

by LANIO STEFAN, FROSIEN JUERGEN
Year of Publication 27.04.2012

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SECONDARY ELECTRON OPTICS & DETECTION DEVICE

by LANIO STEFAN, FROSIEN JUERGEN, WINKLER DIETER, SCHOENECKER GERALD
Year of Publication 01.07.2014

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SCANNING CHARGED PARTICLE BEAM DEVICE HAVING ABERRATION CORRECTION APERTURE AND OPERATION METHOD THEREOF

by FROSIEN JUERGEN DR, STEFAN LANIO, ROY SHILOH, ROEI REMEZ, ADY ARIE
Year of Publication 23.06.2016

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electron beam optical system comprising high brightness electron gun with moving axis condenser lens

by Frosien, Juergen
Year of Publication 09.08.2017

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Method of operating a focused ion beam device with a dual mode gas field ion source

by Winkler, Dieter, Frosien, Juergen
Year of Publication 20.12.2017

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Charged particle beam device with aperture

by Lanio, Stefan, Banzhof, Helmut, Frosien, Juergen
Year of Publication 31.03.2021

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Patent

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HIGH BRIGHTNESS ELECTRON GUN WITH MOVING CONDENSER LENS

by FROSIEN JUERGEN
Year of Publication 19.12.2013

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HIGH BRIGHTNESS ELECTRON GUN WITH MOVING CONDENSER LENS

by FROSIEN JUERGEN
Year of Publication 12.12.2013

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electron beam optical system comprising high brightness electron gun with moving axis condenser lens

by FROSIEN, JUERGEN
Year of Publication 11.12.2013

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Beam optical component having a charged particle lens

by FROSIEN JUERGEN
Year of Publication 21.05.2013

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Electron beam device with tilting and dispersion compensation, and method of operating same

by FROSIEN, JUERGEN
Year of Publication 20.02.2013

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Patent

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Twin beam charged particle column and method of operating thereof

by FROSIEN JUERGEN
Year of Publication 19.02.2013

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SPECTROMETER OBJECTIVE FOR PARTICLE BEAM MEASURING SYSTEM

by SEYAMA MASAHIRO, FROSIEN JUERGEN, KANETAKA AKIRA
Year of Publication 25.07.2001

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ELECTRON BEAM DEVICE WITH TILTING AND DISPERSION COMPENSATION, AND METHOD OF OPERATING SAME

by FROSIEN JUERGEN
Year of Publication 12.01.2012

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Patent

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