Hybrid-orientation technology (HOT): opportunities and challenges
Min Yang, Chan, V.W.C., Chan, K.K., Shi, L., Fried, D.M., Stathis, J.H., Chou, A.I., Gusev, E., Ott, J.A., Burns, L.E., Fischetti, M.V., Meikei Ieong
Published in IEEE transactions on electron devices (01.05.2006)
Published in IEEE transactions on electron devices (01.05.2006)
Get full text
Journal Article
Stable SRAM cell design for the 32 nm node and beyond
Chang, L., Fried, D.M., Hergenrother, J., Sleight, J.W., Dennard, R.H., Montoye, R.K., Sekaric, L., McNab, S.J., Topol, A.W., Adams, C.D., Guarini, K.W., Haensch, W.
Published in Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005 (2005)
Published in Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005 (2005)
Get full text
Conference Proceeding
Dual stress liner enhancement in hybrid orientation technology
Sheraw, C.D., Yang, M., Fried, D.M., Costrini, G., Kanarsky, T., Lee, W.-H., Chan, V., Fischetti, M.V., Holt, J., Black, L., Naeem, M., Panda, S., Economikos, L., Groschopf, J., Kapur, A., Li, Y., Mo, R.T., Bonnoit, A., Degraw, D., Luning, S., Chidambarrao, D., Wang, X., Bryant, A., Brown, D., Sung, C.-Y., Agnello, P., Ieong, M., Huang, S.-F., Chen, X., Khare, M.
Published in Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005 (2005)
Published in Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005 (2005)
Get full text
Conference Proceeding
A Fin-type independent-double-gate NFET
Fried, D.M., Nowak, E.J., Kedzierski, J., Duster, J.S., Komegay, K.T.
Published in 61st Device Research Conference. Conference Digest (Cat. No.03TH8663) (2003)
Published in 61st Device Research Conference. Conference Digest (Cat. No.03TH8663) (2003)
Get full text
Conference Proceeding
Demonstration of FinFET CMOS circuits
Rainey, B.A., Fried, D.M., Ieong, M., Kedzierski, J., Nowak, E.J.
Published in 60th DRC. Conference Digest Device Research Conference (2002)
Published in 60th DRC. Conference Digest Device Research Conference (2002)
Get full text
Conference Proceeding
On the integration of CMOS with hybrid crystal orientations
Yang, M., Chan, V., Ku, S.H., Ieong, M., Shi, L., Chan, K.K., Murthy, C.S., Mo, R.T., Yang, H.S., Lehner, E.A., Surpris, Y., Jamin, F.F., Oldiges, P., Zhang, Y., To, B.N., Holt, J.R., Steen, S.E., Chudzik, M.P., Fried, D.M., Bernstein, K., Zhu, H., Sung, C.Y., Ott, J.A., Boyd, D.C., Rovedo, N.
Published in Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004 (2004)
Published in Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004 (2004)
Get full text
Conference Proceeding
Investigation of CMOS devices with embedded SiGe source/drain on hybrid orientation substrates
Qiqing Ouyang, Min Yang, Holt, J., Panda, S., Huajie Chen, Utomo, H., Fischetti, M., Rovedo, N., Jinghong Li, Klymko, N., Wildman, H., Kanarsky, T., Costrini, G., Fried, D.M., Bryant, A., Ott, J.A., Meikei Ieong, Chun-Yung Sung
Published in Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005 (2005)
Published in Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005 (2005)
Get full text
Conference Proceeding
A sub 40-nm body thickness n-type FinFET
Fried, D.M., Johnson, A.P., Nowak, E.J., Rankin, J.H., Willets, C.R.
Published in Device Research Conference. Conference Digest (Cat. No.01TH8561) (2001)
Published in Device Research Conference. Conference Digest (Cat. No.01TH8561) (2001)
Get full text
Conference Proceeding
Challenges and Opportunities for High Performance 32 nm CMOS Technology
Sleight, J.W., Lauer, I., Dokumaci, O., Fried, D.M., Guo, D., Haran, B., Narasimha, S., Sheraw, C., Singh, D., Steigerwalt, M., Wang, X., Oldiges, P., Sadana, D., Sung, C.Y., Haensch, W., Khare, M.
Published in 2006 International Electron Devices Meeting (01.12.2006)
Published in 2006 International Electron Devices Meeting (01.12.2006)
Get full text
Conference Proceeding
A functional FinFET-DGCMOS SRAM cell
Nowak, E.J., Rainey, B.A., Fried, D.M., Kedzierski, J., Ieong, M., Leipold, W., Wright, J., Breitwisch, M.
Published in Digest. International Electron Devices Meeting (2002)
Published in Digest. International Electron Devices Meeting (2002)
Get full text
Conference Proceeding
Scaling beyond the 65 nm node with FinFET-DGCMOS
Nowak, E.J., Ludwig, T., Aller, I., Kedzierski, J., Leong, M., Rainey, B., Breitwisch, M., Gemhoefer, V., Keinert, J., Fried, D.M.
Published in Proceedings of the IEEE 2003 Custom Integrated Circuits Conference, 2003 (2003)
Published in Proceedings of the IEEE 2003 Custom Integrated Circuits Conference, 2003 (2003)
Get full text
Conference Proceeding
Aggressively scaled (0.143 /spl mu/m/sup 2/) 6T-SRAM cell for the 32 nm node and beyond
Fried, D.M., Hergenrother, J.M., Topol, A.W., Chang, L., Sekaric, L., Sleight, J.W., McNab, S.J., Newbury, J., Steen, S.E., Gibson, G., Zhang, Y., Fuller, N.C.M., Bucchignano, J., Lavoie, C., Cabral Jr, C., Canaperi, D., Dokumaci, O., Frank, D.J., Duch, E.A., Babich, I., Wong, K., Ott, J.A., Adams, C.D., Dalton, T.J., Nunes, R., Medeiros, D.R., Viswanathan, R., Ketchen, M., Ieong, M., Haensch, W., Guarini, K.W.
Published in IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 (2004)
Published in IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 (2004)
Get full text
Conference Proceeding
High-performance symmetric-gate and CMOS-compatible V/sub t/ asymmetric-gate FinFET devices
Kedzierski, J., Fried, D.M., Nowak, E.J., Kanarsky, T., Rankin, J.H., Hanafi, H., Natzle, W., Boyd, D., Ying Zhang, Roy, R.A., Newbury, J., Chienfan Yu, Qingyun Yang, Saunders, P., Willets, C.P., Johnson, A., Cole, S.P., Young, H.E., Carpenter, N., Rakowski, D., Rainey, B.A., Cottrell, P.E., Ieong, M., Wong, H.-S.P.
Published in International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) (2001)
Published in International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) (2001)
Get full text
Conference Proceeding