Reliability of Solid-State Drives Based on NAND Flash Memory
Mielke, Neal R., Frickey, Robert E., Kalastirsky, Ivan, Quan, Minyan, Ustinov, Dmitry, Vasudevan, Venkatesh J.
Published in Proceedings of the IEEE (01.09.2017)
Published in Proceedings of the IEEE (01.09.2017)
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Journal Article
Comparing the Reliability of Solid-State Drives Based on TLC and QLC NAND Flash Memories (Invited)
Frickey, Robert, Doller, Joseph, Norton, Robert, Sancho, Roman, Sayyad, Rakhshanda, Ustinov, Dmitry, Wang, Raymond, Xu, Harvey
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
SSD Drive Failure Prediction on Alibaba Data Center Using Machine Learning
Chen, Lei, Zhu, Zongpeng, Li, Anyu, Mashhadi, Najmeh, Frickey, Robert, Ye, Jinhe, Guo, Xin
Published in 2022 IEEE International Memory Workshop (IMW) (01.05.2022)
Published in 2022 IEEE International Memory Workshop (IMW) (01.05.2022)
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Conference Proceeding
Data recovery in memory devices
Kalavade, Pranav, Wu, Ning, Ganesan, Ramkarthik, Guo, Xin, Frickey, Robert
Year of Publication 28.05.2019
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Year of Publication 28.05.2019
Patent
DATA RECOVERY IN MEMORY DEVICES
Ganesan Ramkarthik, Guo Xin, Wu Ning, Kalavade Pranav, Frickey Robert
Year of Publication 04.05.2017
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Year of Publication 04.05.2017
Patent
Reliability issues studied in Solid-State Drives
Pon, Harry Q., Dayacap, Justin R., Frickey, Robert E., Gogineni, Sireesha, Joseph, Peter, Lin, Eric S., Pon, Florence R., Slattery, James P.
Published in 2014 IEEE 6th International Memory Workshop (IMW) (01.05.2014)
Published in 2014 IEEE 6th International Memory Workshop (IMW) (01.05.2014)
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Conference Proceeding