Reversed Phase Ion-Pair Liquid Chromatographic Determination of Nicotine in Commercial Tobacco Products. 2. Cigarettes
Ciolino, Laura A, Fraser, Diane B, Yi, Timothy Y, Turner, James A, Barnett, Debra Y, McCauley, Heather A
Published in Journal of agricultural and food chemistry (01.09.1999)
Published in Journal of agricultural and food chemistry (01.09.1999)
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Reversed Phase Ion-Pair Liquid Chromatographic Determination of Nicotine in Commercial Tobacco Products. 1. Moist Snuff
Ciolino, Laura A, McCauley, Heather A, Fraser, Diane B, Barnett, Debra Y, Yi, Timothy Y, Turner, James A
Published in Journal of agricultural and food chemistry (01.09.1999)
Published in Journal of agricultural and food chemistry (01.09.1999)
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Journal Article
Diffusion of copper through dielectric films under bias temperature stress
Raghavan, Gopal, Chiang, Chien, Anders, Paul B., Tzeng, Sing-Mo, Villasol, Reynaldo, Bai, Gang, Bohr, Mark, Fraser, David B.
Published in Thin solid films (15.06.1995)
Published in Thin solid films (15.06.1995)
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Extracorporeal shock-wave lithotripsy in the management of bile duct stones
Fried, LA, LeBrun, GP, Norman, RW, Fraser, DB, Taylor, MC, Roy, PD, Marshall, JC
Published in American journal of roentgenology (1976) (01.11.1988)
Published in American journal of roentgenology (1976) (01.11.1988)
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Resistivities of Thin Film Transition Metal Silicides
Murarka, S. P., Read, M. H., Doherty, C. J., Fraser, D. B.
Published in Journal of the Electrochemical Society (01.02.1982)
Published in Journal of the Electrochemical Society (01.02.1982)
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Self-aligned cobalt disilicide for gate and interconnection and contacts to shallow junctions
Murarka, S.P., Fraser, D.B., Sinha, A.K., Levinstein, H.J., Lloyd, E.J., Liu, R., Williams, D.S., Hillenius, S.J.
Published in IEEE transactions on electron devices (01.10.1987)
Published in IEEE transactions on electron devices (01.10.1987)
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A novel technique for in-line monitoring of micro-contamination and process induced damage
Murali, V., Wu, A.T., Chatterjee, A.K., Fraser, D.B.
Published in IEEE transactions on semiconductor manufacturing (01.08.1992)
Published in IEEE transactions on semiconductor manufacturing (01.08.1992)
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