Relevant metrics for evaluation of concurrent error detection schemes
de Vasconcelos, Maí C.R., Franco, Denis T., Naviner, Lirida A.B., Naviner, Jean-François
Published in Microelectronics and reliability (01.08.2008)
Published in Microelectronics and reliability (01.08.2008)
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Journal Article
Conference Proceeding
A probabilistic model for stuck-on faults in combinational logic gates
Schivittz, Rafael B., Franco, Denis T., Meinhardt, Cristina, Butzen, Paulo F.
Published in 2016 17th Latin-American Test Symposium (LATS) (01.04.2016)
Published in 2016 17th Latin-American Test Symposium (LATS) (01.04.2016)
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Conference Proceeding
Probabilistic Method for Reliability Estimation of SP- Networks considering Single Event Transient Faults
Schvittz, Rafael, Franco, Denis T., Rosa, Leomar S., Butzen, Paulo F.
Published in 2018 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS) (01.12.2018)
Published in 2018 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS) (01.12.2018)
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Conference Proceeding
Exploring BDDs to reduce test pattern set
Porto, Gabriel S., Butzen, Paulo F., Franco, Denis T.
Published in 2017 18th IEEE Latin American Test Symposium (LATS) (01.03.2017)
Published in 2017 18th IEEE Latin American Test Symposium (LATS) (01.03.2017)
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Conference Proceeding
The Suitability of the SPR-MP Method to Evaluate the Reliability of Logic Circuits
Pontes, Matheus F., Butzen, Paulo F., Schvittz, Rafael B., Rosa, S. Leomar, Franco, Denis T.
Published in 2018 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS) (01.12.2018)
Published in 2018 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS) (01.12.2018)
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Conference Proceeding
Inserting permanent fault input dependence on PTM to improve robustness evaluation
Schivittz, Rafael B., Fritz, Rafael, Franco, Denis T., Naviner, Lirida, Meinhardt, Cristina, Butzen, Paulo F.
Published in 2016 29th Symposium on Integrated Circuits and Systems Design (SBCCI) (01.08.2016)
Published in 2016 29th Symposium on Integrated Circuits and Systems Design (SBCCI) (01.08.2016)
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Conference Proceeding
Reliability analysis of combinational circuits based on a probabilistic binomial model
de Vasconcelos, M., Franco, D.T., de B. Naviner, L.A., Naviner, J.-F.
Published in 2008 Joint 6th International IEEE Northeast Workshop on Circuits and Systems and TAISA Conference (01.06.2008)
Published in 2008 Joint 6th International IEEE Northeast Workshop on Circuits and Systems and TAISA Conference (01.06.2008)
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Conference Proceeding
Efficient computation of logic circuits reliability based on Probabilistic Transfer Matrix
Naviner, L.A.B., de Vasconcelos, M.C.R., Franco, D.T., Naviner, J.-F.
Published in 2008 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era (01.03.2008)
Published in 2008 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era (01.03.2008)
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Conference Proceeding
On the output events in concurrent error detection schemes
de Vasconcelos, M.C.R., Franco, D.T., de B. Naviner, L.A., Naviner, J.-F.
Published in 2008 15th IEEE International Conference on Electronics, Circuits and Systems (01.08.2008)
Published in 2008 15th IEEE International Conference on Electronics, Circuits and Systems (01.08.2008)
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Conference Proceeding
A FPGA version of a non-linear adaptive filter
Franco, D.T., Carro, L.
Published in Proceedings. XII Symposium on Integrated Circuits and Systems Design (Cat. No.PR00387) (1999)
Published in Proceedings. XII Symposium on Integrated Circuits and Systems Design (Cat. No.PR00387) (1999)
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Conference Proceeding