1100 × 1100 port MEMS-based optical crossconnect with 4-dB maximum loss
Kim, J, Nuzman, C.J, Kumar, B, Lieuwen, D.F, Kraus, J.S, Weiss, A, Lichtenwalner, C.P, Papazian, A.R, Frahm, R.E, Basavanhally, N.R, Ramsey, D.A, Aksyuk, V.A, Pardo, F, Simon, M.E, Lifton, V, Chan, H.B, Haueis, M, Gasparyan, A, Shea, H.R, Arney, S, Bolle, C.A, Kolodner, P.R, Ryf, R, Neilson, D.T, Gates, J.V
Published in IEEE photonics technology letters (01.11.2003)
Published in IEEE photonics technology letters (01.11.2003)
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Journal Article
1100 x 1100 port MEMS-based optical crossconnect with 4-dB maximum loss
Kim, J., Nuzman, C.J., Kumar, B., Lieuwen, D.F., Kraus, J.S., Weiss, A., Lichtenwalner, C.P., Papazian, A.R., Frahm, R.E., Basavanhally, N.R., Ramsey, D.A., Aksyuk, V.A., Pardo, F., Simon, M.E., Lifton, V., Chan, H.B., Haueis, M., Gasparyan, A., Shea, H.R., Arney, S., Bolle, C.A., Kolodner, P.R., Ryf, R., Neilson, D.T., Gates, J.V.
Published in IEEE photonics technology letters (01.11.2003)
Published in IEEE photonics technology letters (01.11.2003)
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Journal Article
Effects of electrical leakage currents on MEMS reliability and performance
Shea, H.R., Gasparyan, A., Ho Bun Chan, Arney, S., Frahm, R.E., Lopez, D., Sungho Jin, McConnell, R.P.
Published in IEEE transactions on device and materials reliability (01.06.2004)
Published in IEEE transactions on device and materials reliability (01.06.2004)
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Magazine Article
Training 1100 /spl times/ 1100-port MEMS-based optical crossconnect switches
Kim, J., Nuzman, C.J., Kumar, B., Lieuwen, D.F., Kraus, J.S., Weiss, A., Lichtenwalner, C.P., Papazian, A.R., Frahm, R.E., Gates, J.V.
Published in Conference on Lasers and Electro-Optics, 2004. (CLEO) (2004)
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Published in Conference on Lasers and Electro-Optics, 2004. (CLEO) (2004)
Conference Proceeding
Performance of large scale MEMS-based optical crossconnect switches
Jungsang Kim, Papazian, A.R., Frahm, R.E., Gates, J.V.
Published in The 15th Annual Meeting of the IEEE Lasers and Electro-Optics Society (2002)
Published in The 15th Annual Meeting of the IEEE Lasers and Electro-Optics Society (2002)
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Conference Proceeding
Design for reliability of MEMS/MOEMS for lightwave telecommunications
Shea, H.R., Arney, S., Gasparyan, A., Haueis, M., Aksyuk, V.A., Bolle, C.A., Frahm, R.E., Goyal, S., Pardo, F., Simon, M.E.
Published in The 15th Annual Meeting of the IEEE Lasers and Electro-Optics Society (2002)
Published in The 15th Annual Meeting of the IEEE Lasers and Electro-Optics Society (2002)
Get full text
Conference Proceeding