Accelerated degradation data of SiC MOSFETs for lifetime and Remaining Useful Life assessment
Santini, T., Morand, S., Fouladirad, M., Phung, L.V., Miller, F., Foucher, B., Grall, A., Allard, B.
Published in Microelectronics and reliability (01.09.2014)
Published in Microelectronics and reliability (01.09.2014)
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Conference Proceeding
A review of reliability prediction methods for electronic devices
Foucher, B, Boullié, J, Meslet, B, Das, D
Published in Microelectronics and reliability (01.08.2002)
Published in Microelectronics and reliability (01.08.2002)
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Journal Article
Analysis of deep submicron VLSI technological risks: A new qualification process for professional electronics
Molière, F., Foucher, B., Perdu, P., Bravaix, A.
Published in Microelectronics and reliability (01.09.2009)
Published in Microelectronics and reliability (01.09.2009)
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Journal Article
Conference Proceeding
Plasmacytosis and dengue fever: an underestimated abnormality?
Gérôme, P, Foucher, B, Otto, M-P, Crevon, L, Rabar, D, Pasquet, F, Tolou, H
Published in La revue de medecine interne (01.06.2012)
Published in La revue de medecine interne (01.06.2012)
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Journal Article
Backside SEU laser testing for commercial off-the-shelf SRAMs
Darracq, F., Lapuyade, H., Buard, N., Mounsi, F., Foucher, B., Fouillat, P., Calvet, M.-C., Dufayel, R.
Published in IEEE transactions on nuclear science (01.12.2002)
Published in IEEE transactions on nuclear science (01.12.2002)
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Journal Article
Life margin assessment with Physics of Failure Tools application to BGA packages
Foucher, B., Tomas, J., Mounsi, F., Jeremias, M.
Published in Microelectronics and reliability (01.05.2006)
Published in Microelectronics and reliability (01.05.2006)
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Journal Article
Urine Dipstick Screening tests: can they allow to conclude the absence of a urinary tract infection in diabetic hospitalised patients
Gérôme, P, Foucher, B, Prevosto, J-M, Chevalier, B, Cheminel, V, Bigois, L, Debourdeau, P, Colle, B
Published in Annales de biologie clinique (Paris) (01.03.2009)
Published in Annales de biologie clinique (Paris) (01.03.2009)
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Plasmocytose sanguine et dengue : une anomalie biologique sous-estimée ?
Gérôme, P., Foucher, B., Otto, M.-P., Crevon, L., Rabar, D., Pasquet, F., Tolou, H.
Published in La revue de medecine interne (01.06.2012)
Published in La revue de medecine interne (01.06.2012)
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Journal Article
Development and use of a miniaturized health monitoring device
Rouet, V., Foucher, B.
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)
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Conference Proceeding
ESD evaluation of a low voltage triggering SCR (LVTSCR) device submitted to transmission line pulse (TLP) test
Guilhaume, A, Galy, P, Chante, J.P, Foucher, B, Bardy, S, Blanc, F
Published in Journal of electrostatics (01.10.2002)
Published in Journal of electrostatics (01.10.2002)
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Journal Article
Severe catheter related bacteremia due to Pseudomonas luteola
Otto, M.-P., Foucher, B., Dardare, E., Gérôme, P.
Published in Médecine et maladies infectieuses (01.04.2013)
Published in Médecine et maladies infectieuses (01.04.2013)
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Simulation and experimental comparison of GGNMOS and LVTSCR protection cells under ElectroStatic Discharges
Guilhaume, A., Galy, P., Chante, JP, Foucher, B., Blanc, F.
Published in Microelectronics and reliability (01.09.2001)
Published in Microelectronics and reliability (01.09.2001)
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Journal Article
Numerical investigation for a Grounded Gate NMOS Transistor under electrostatic discharge (ESD) through TLP method
Galy, P., Berland, V., Foucher, B., Lombaert-Valot, I., Guilhaume, A., Chante, J.P., Dufrenne, S., Bardy, S.
Published in Microelectronics and reliability (01.08.2000)
Published in Microelectronics and reliability (01.08.2000)
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Life cycle cost impact of using prognostic health management (PHM) for helicopter avionics
Scanff, E., Feldman, K.L., Ghelam, S., Sandborn, P., Glade, M., Foucher, B.
Published in Microelectronics and reliability (01.12.2007)
Published in Microelectronics and reliability (01.12.2007)
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Journal Article
Numerical study of a gg-nMOS protection transistor under ionizing radiation and electrostatic discharge
Galy, Ph, Berland, V., Guilhaume, A., Foucher, B.
Published in RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605) (2001)
Published in RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605) (2001)
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Conference Proceeding
N-glycans harboring the Lewis a epitope are expressed at the surface of plant cells
Fichette-Laine, A.C, Gomord, V, Cabanes, M, Michalski, J.C, Saint Macary, M, Foucher, B, Cavelier, B, Hawes, C, Lerouge, P, Faye, L
Published in The Plant journal : for cell and molecular biology (01.12.1997)
Published in The Plant journal : for cell and molecular biology (01.12.1997)
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Life cycle cost impact of using prognostic health management (PHM) for helicopter avionics : Electronic system prognostics and health TH management
SCANFF, E, FELDMAN, K. L, GHELAM, S, SANDBORN, P, GLADE, M, FOUCHER, B
Published in Microelectronics and reliability (2007)
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Published in Microelectronics and reliability (2007)
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