Towards Complete Recovery of Circuit Degradation by Annealing With On-Chip Heaters
Diaz-Fortuny, J., Saraza-Canflanca, P., Lofrano, M., Bury, E., Degraeve, R., Kaczer, B.
Published in IEEE electron device letters (01.02.2023)
Published in IEEE electron device letters (01.02.2023)
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Journal Article
Unveiling the Vulnerability of Oxide-Breakdown-Based PUF
Saraza-Canflanca, P., Fodor, F., Diaz-Fortuny, J., Gierlichs, B., Degraeve, R., Kaczer, B., Verbauwhede, I., Bury, E.
Published in IEEE electron device letters (01.05.2024)
Published in IEEE electron device letters (01.05.2024)
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Journal Article
Using dedicated device arrays for the characterization of TDDB in a scaled HK/MG technology
Saraza-Canflanca, P., Diaz-Fortuny, J., Vici, A., Bury, E., Degraeve, R., Kaczer, B.
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
Assessment of Transistor Aging Models in a 28nm CMOS Technology at a Wide Range of Stress Conditions
Sangani, D., Diaz-Fortuny, J., Bury, E., Kaczer, B., Gielen, G.
Published in 2022 IEEE International Integrated Reliability Workshop (IIRW) (09.10.2022)
Published in 2022 IEEE International Integrated Reliability Workshop (IIRW) (09.10.2022)
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Conference Proceeding
Statistical Characterization of Off-State Stress Degradation in Planar HKMG nFETs Using Device Arrays
Saraza-Canflanca, P., Sangani, D., Diaz-Fortuny, J., Tyaginov, S., Gielen, G., Bury, E., Kaczer, B.
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level
Saraza-Canflanca, P., Diaz-Fortuny, J., Castro-Lopez, R., Roca, E., Martin-Martinez, J., Rodriguez, R., Nafria, M., Fernandez, F.V.
Published in Integration (Amsterdam) (01.05.2020)
Published in Integration (Amsterdam) (01.05.2020)
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Journal Article
A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies
Saraza-Canflanca, P., Carrasco-Lopez, H., Santana-Andreo, A., Diaz-Fortuny, J., Castro-Lopez, R., Roca, E., Fernandez, F. V.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Reliability challenges in Forksheet Devices: (Invited Paper)
Bury, E., Vandemaele, M., Franco, J., Chasin, A., Tyaginov, S., Vandooren, A., Ritzenthaler, R., Mertens, H., Fortuny, J. Diaz, Horiguchi, N., Linten, D., Kaczer, B.
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor Arrays
Grill, A., Michl, J., Diaz-Fortuny, J., Beckers, A., Bury, E., Chasin, A., Grasser, T., Waltl, M., Kaczer, B., De Greve, K.
Published in 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (07.03.2023)
Published in 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (07.03.2023)
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Conference Proceeding
Circuit reliability prediction: challenges and solutions for the device time-dependent variability characterization roadblock
Nafria, M., Diaz-Fortuny, J., Saraza-Canflanca, P., Martin-Martinez, J., Roca, E., Castro-Lopez, R., Rodriguez, R., Martin-Lloret, P., Toro-Frias, A., Mateo, D., Barajas, E., Aragones, X., Fernandez, F. V.
Published in 2021 IEEE Latin America Electron Devices Conference (LAEDC) (19.04.2021)
Published in 2021 IEEE Latin America Electron Devices Conference (LAEDC) (19.04.2021)
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Conference Proceeding
New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors
Saraza-Canflanca, P., Diaz-Fortuny, J., Castro-Lopez, R., Roca, E., Martin-Martinez, J., Rodriguez, R., Nafria, M., Fernandez, F. V.
Published in 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2019)
Published in 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2019)
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Conference Proceeding
A New Time Efficient Methodology for the Massive Characterization of RTN in CMOS Devices
Pedreira, G., Martin-Martinez, J., Diaz-Fortuny, J., Saraza-Canflanca, P., Rodriguez, R., Castro-Lopez, R., Roca, E., Fernandez, F. V., Nafria, M.
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
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Conference Proceeding
Dedicated ICs for the Characterization of Variability and Aging Studies and their Use in Lightweight Security Applications : Invited paper
Diaz-Fortuny, J., Saraza-Canflanca, P., Vandemaele, M., Bury, E., Degraeve, R., Kaczer, B.
Published in 2022 IEEE Latin American Electron Devices Conference (LAEDC) (04.07.2022)
Published in 2022 IEEE Latin American Electron Devices Conference (LAEDC) (04.07.2022)
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Conference Proceeding
Gate oxide reliability: upcoming trends, challenges, and opportunities
Kaczer, B., Degraeve, R., Franco, J., Grasser, T., Roussel, Ph. J., Bury, E., Weckx, P., Chasin, A., Tyaginov, S., Vandemaele, M., Grill, A., O'Sullivan, B., Fortuny, J. Diaz, Canflanca, P. Saraza, Waltl, M., Rinaudo, P., Zhao, Y., Kao, E., Asanovski, R., Catapano, E., Beckers, A., Vici, A., Truijen, B., Higashi, Y., Clima, S., Xiang, Y., Sangani, D., Panarella, L., Smets, Q., Knobloch, T., Waldhor, D., Van Troeye, B., Guo, Y., Kruv, A., Viswakarma, K., Gonzalez, M., Linten, D.
Published in 2024 IEEE Silicon Nanoelectronics Workshop (SNW) (15.06.2024)
Published in 2024 IEEE Silicon Nanoelectronics Workshop (SNW) (15.06.2024)
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Conference Proceeding
TARS: A toolbox for statistical reliability modeling of CMOS devices
Diaz-Fortuny, J., Martin-Martinez, J., Rodriguez, R., Nafria, M., Castro-Lopez, R., Roca, E., Fernandez, F. V.
Published in 2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (01.06.2017)
Published in 2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (01.06.2017)
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Conference Proceeding
TiDeVa: A Toolbox for the Automated and Robust Analysis of Time-Dependent Variability at Transistor Level
Saraza-Canflanca, P., Diaz-Fortuny, J., Castro-Lopez, R., Roca, E., Martin-Martinez, J., Rodriguez, R., Nafria, M., Fernandez, F.V.
Published in 2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (01.07.2019)
Published in 2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (01.07.2019)
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Conference Proceeding
A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging
Diaz-Fortuny, J., Martin-Martinez, J., Rodriguez, R., Nafria, M., Castro-Lopez, R., Roca, E., Fernandez, F. V., Barajas, E., Aragones, X., Mateo, D.
Published in 2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (01.06.2017)
Published in 2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (01.06.2017)
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Conference Proceeding