Accuracy assessment of elastic strain measurement by EBSD
VILLERT, S, MAURICE, C, WYON, C, FORTUNIER, R
Published in Journal of microscopy (Oxford) (01.02.2009)
Published in Journal of microscopy (Oxford) (01.02.2009)
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Journal Article
Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns
Britton, T.B., Maurice, C., Fortunier, R., Driver, J.H., Day, A.P., Meaden, G., Dingley, D.J., Mingard, K., Wilkinson, A.J.
Published in Ultramicroscopy (01.11.2010)
Published in Ultramicroscopy (01.11.2010)
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Journal Article
Impact of the transient formation of molecular hydrogen on the microcrack nucleation and evolution in H-implanted Si (001)
Personnic, S., Bourdelle, K. K., Letertre, F., Tauzin, A., Cherkashin, N., Claverie, A., Fortunier, R., Klocker, H.
Published in Journal of applied physics (15.01.2008)
Published in Journal of applied physics (15.01.2008)
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Journal Article
Heat affected zone in aluminum single crystals submitted to femtosecond laser irradiations
Valette, S., Audouard, E., Le Harzic, R., Huot, N., Laporte, P., Fortunier, R.
Published in Applied surface science (31.01.2005)
Published in Applied surface science (31.01.2005)
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Journal Article
Three-dimensional finite-element simulation of Zener pinning dynamics
COUTURIER, G, MAURICE, C, FORTUNIER, R
Published in Philosophical magazine (Abingdon, England) (21.10.2003)
Published in Philosophical magazine (Abingdon, England) (21.10.2003)
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Journal Article
X-ray analysis of mechanical and thermal effects induced by femtosecond laser treatment of aluminum single crystals
Valette, S., Le Harzic, R., Audouard, E., Huot, N., Fillit, R., Fortunier, R.
Published in Applied surface science (30.04.2006)
Published in Applied surface science (30.04.2006)
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Journal Article
Conference Proceeding
Analysis of nickel cylindrical bump insertion into aluminium thin film for flip chip applications
Diop, M.D., Mandrillon, V., Boutry, H., Inal, K., Fortunier, R.
Published in Microelectronic engineering (01.03.2010)
Published in Microelectronic engineering (01.03.2010)
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Conference Proceeding
A thermo-mechanical analysis of stability in dieless wire drawing
Fortunier, R., Sassoulas, H., Montheillet, F.
Published in International journal of mechanical sciences (01.05.1997)
Published in International journal of mechanical sciences (01.05.1997)
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Journal Article
Continuous in situ measurement of quenching distortions using computer vision
Claudinon, S, Lamesle, P, Orteu, J.J, Fortunier, R
Published in Journal of materials processing technology (05.03.2002)
Published in Journal of materials processing technology (05.03.2002)
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Journal Article
Impact of Pitch Reduction over Residual Strain of Flip Chip Solder Bump after Reflow
Davoine, C., Fendler, M., Louis, C., Fortunier, R.
Published in EuroSime 2006 - 7th International Conference on Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems (2006)
Published in EuroSime 2006 - 7th International Conference on Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems (2006)
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Conference Proceeding
Low temperature diffusion of impurities in hydrogen implanted silicon
Personnic, S., Bourdelle, K. K., Letertre, F., Tauzin, A., Laugier, F., Fortunier, R., Klocker, H.
Published in Journal of applied physics (15.04.2007)
Published in Journal of applied physics (15.04.2007)
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Journal Article
Embedded Stress Sensors for Strained Technologies Process Control
Kasbari, M., Delamare, R., Blayac, S., Rivero, C., Fortunier, R.
Published in IEEE transactions on semiconductor manufacturing (01.08.2008)
Published in IEEE transactions on semiconductor manufacturing (01.08.2008)
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Journal Article