by Catunda, S.Y.C., Gabriel, M.V., Sousa, F.R., Freire, R.C.S., FonsecaNeto, J.V.
Published in Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) (2004)

by Mouzinho, L.F., FonsecaNeto, J.V., Luciano, B.A., Freire, R.C.S., Catunda, S.Y.C.
Published in 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings (01.04.2006)

by Mouzinho, L.F., FonsecaNeto, J.V., Luciano, B.A., Freire, R.C.S., Catunda, S.Y.
Published in 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings (2005)

by Catunda, S.Y.C., Saavedra, O.R., FonsecaNeto, J.V., Morais, M.R.A.
Published in Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) (2003)

by Catunda, S.Y.C., Pessanha, J.E.O., FonsecaNeto, J.V., Camelo, N.J., Silva, P.R.M.
Published in Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) (2004)

by Mouzinho, L.F., Fonsecaneto, J.V., Luciano, B.A., Freire, R.C.S., de Barros, J., Fontgalland, G.
Published in 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings (2005)