Estimation of Heavy-Ion LET Thresholds in Advanced SOI IC Technologies From Two-Photon Absorption Laser Measurements
Schwank, J R, Shaneyfelt, M R, McMorrow, D, Ferlet-Cavrois, V, Dodd, P E, Heidel, D F, Marshall, P W, Pellish, J A, LaBel, K A, Rodbell, K P, Hakey, M, Flores, R S, Swanson, S E, Dalton, S M
Published in IEEE transactions on nuclear science (01.08.2010)
Published in IEEE transactions on nuclear science (01.08.2010)
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Journal Article
Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic Chains
Dodd, P. E., Shaneyfelt, M. R., Flores, R. S., Schwank, J. R., Hill, T. A., McMorrow, D., Vizkelethy, G., Swanson, S. E., Dalton, S. M.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Journal Article
Direct Comparison of Charge Collection in SOI Devices From Single-Photon and Two-Photon Laser Testing Techniques
Schwank, J R, Shaneyfelt, M R, Dodd, P E, McMorrow, D, Vizkelethy, G, Ferlet-Cavrois, V, Gouker, P M, Flores, R S, Stevens, J, Buchner, S B, Dalton, S M, Swanson, S E
Published in IEEE transactions on nuclear science (01.06.2011)
Published in IEEE transactions on nuclear science (01.06.2011)
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Journal Article
An Embeddable SOI Radiation Sensor
Shaneyfelt, M.R., Hill, T.A., Gurrieri, T.M., Schwank, J.R., Flores, R.S., Dodd, P.E., Dalton, S.M., Robinson, A.
Published in IEEE transactions on nuclear science (01.12.2009)
Published in IEEE transactions on nuclear science (01.12.2009)
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ViArray standard platforms: Rad-hard structured ASICs for digital and mixed-signal applications
Teifel, J., Flores, R. S., Pearson, S., Begay, C., Kwok Kee Ma, Palmer, J.
Published in 2012 IEEE Aerospace Conference (01.03.2012)
Published in 2012 IEEE Aerospace Conference (01.03.2012)
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Conference Proceeding
Identification of radiation-induced parasitic leakage paths using light emission microscopy
Shaneyfelt, M.R., Paiboon Tangyunyong, Hill, T.A., Soden, J.M., Flores, R.S., Schwank, J.R., Dodd, P.E., Hash, G.L.
Published in IEEE transactions on nuclear science (01.10.2004)
Published in IEEE transactions on nuclear science (01.10.2004)
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A quick-turn 3D structured ASIC platform for cost-sensitive applications
Teifel, John, Flores, Richard S., Jarecki, Robert, Bauer, Todd, Shinde, Subhash L.
Published in 2013 IEEE 63rd Electronic Components and Technology Conference (01.05.2013)
Published in 2013 IEEE 63rd Electronic Components and Technology Conference (01.05.2013)
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Conference Proceeding
Three-dimensional stacked structured ASIC devices and methods of fabrication thereof
SHINDE SUBHASH L, TEIFEL JOHN, JARECKI, JR. ROBERT L, BAUER TODD, FLORES RICHARD S
Year of Publication 17.11.2015
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Year of Publication 17.11.2015
Patent
Estimation of heavy-ion LET thresholds in advanced SOI IC technologies from two-photon absorption laser measurements
Schwank, J. R., Shaneyfelt, M. R., McMorrow, D., Ferlet-Cavrois, V., Dodd, P. E., Heidel, D. F., Marshall, P. W., Pellish, J. A., LaBel, K. A., Rodbell, K. P., Hakey, M., Flores, R. S., Swanson, S. E., Dalton, S. M.
Published in 2009 European Conference on Radiation and Its Effects on Components and Systems (01.09.2009)
Published in 2009 European Conference on Radiation and Its Effects on Components and Systems (01.09.2009)
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Conference Proceeding
Identification of radiation-induced parasitic leakage paths using light emission microscopy
Shaneyfelt, M.R., Tangyunyong, P., Hill, T.A., Soden, J.M., Flores, R.S., Schwank, J.R., Dodd, P.E., Hash, G.L.
Published in Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003 (2003)
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Published in Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003 (2003)
Conference Proceeding
A Radiation-Hard Silicon Gate Bulk CMOS Cell Family
Gibbon, Charles F., Habing, Donald H., Flores, Richard S.
Published in IEEE transactions on nuclear science (01.01.1980)
Published in IEEE transactions on nuclear science (01.01.1980)
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Journal Article