Towards easy and reliable AFM tip shape determination using blind tip reconstruction
Flater, Erin E., Zacharakis-Jutz, George E., Dumba, Braulio G., White, Isaac A., Clifford, Charles A.
Published in Ultramicroscopy (01.11.2014)
Published in Ultramicroscopy (01.11.2014)
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Journal Article
Error estimation and enhanced stiffness sensitivity in contact resonance force microscopy with a multiple arbitrary frequency lock-in amplifier (MAFLIA)
Flater, Erin E, Mugdha, Arya C, Gupta, Saurabh, Hudson, William A, Fahrenkamp, Abbigail A, Killgore, Jason P, Wilson, Jesse W
Published in Measurement science & technology (01.11.2020)
Published in Measurement science & technology (01.11.2020)
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Journal Article
A simple atomic force microscope-based method for quantifying wear of sliding probes
Flater, Erin E, Barnes, Jared D, Hitz Graff, Jesse A, Weaver, Jayse M, Ansari, Naveed, Poda, Aimee R, Robert Ashurst, W, Khanal, Subarna R, Jacobs, Tevis D B
Published in Review of scientific instruments (01.11.2018)
Published in Review of scientific instruments (01.11.2018)
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Journal Article
In situ wear studies of surface micromachined interfaces subject to controlled loading
Flater, Erin E., Corwin, Alex D., de Boer, Maarten P., Carpick, Robert W.
Published in Wear (10.03.2006)
Published in Wear (10.03.2006)
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Journal Article