Radiation damage characterization of digital integrated circuits
Sondon, S., Mandolesi, P., Julian, P., Palumbo, F., Alurralde, M., Filevich, A.
Published in 2009 10th Latin American Test Workshop (01.03.2009)
Published in 2009 10th Latin American Test Workshop (01.03.2009)
Get full text
Conference Proceeding