Certifying the Degree of Perfection of Silicon Single Crystals for the Avogadro Project by Measuring the Amount of Copper Silicide Precipitated in the Voids
Spaepen, F., Wen, C.Y., Quetel, C., Aninkevicius, V., Filee, K., Proost, J., Taylor, P.D.P., De Bievre, P.
Published in 2004 Conference on Precision Electromagnetic Measurements (01.06.2004)
Published in 2004 Conference on Precision Electromagnetic Measurements (01.06.2004)
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